نتائج البحث

Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction.

• Authors : Davtyan, Arman¹; Lehmann, Sebastian²; Kriegner, Dominik³

• Source: Journal of Synchrotron Radiation. Sep2017, Vol. 24 Issue 5, p981-990. 9p.

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Nanoscale mapping of carrier collection in single nanowire solar cells using X‐ray beam induced current.

• Authors : Chayanun, Lert¹; Otnes, Gaute²; Troian, Andrea¹

• Source: Journal of Synchrotron Radiation. Jan2019, Vol. 26 Issue 1, p102-108. 7p.

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Nanoscale mapping of carrier collection in single nanowire solar cells using X-ray beam induced current

• Authors : Susanna Hammarberg; Magnus T. Borgström; Lert Chayanun

Subjects: Nuclear and High Energy Physics; Materials science; 030303 biophysics

• Source: 'Journal of Synchrotron Radiation ', vol: 26, pages: 102-108 (2019)Journal of Synchrotron Radiation

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X-ray diffraction strain analysis of a single axial InAs1- xP x nanowire segment.

• Authors : Keplinger, Mario; Mandl, Bernhard; Kriegner, Dominik

• Source: Journal of Synchrotron Radiation. Jan2015, Vol. 22 Issue 1, p59-66. 8p.

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X-ray diffraction strain analysis of a single axial InAs1–xPx nanowire segment

• Authors : Keplinger, Mario; Mandl, Bernhard; Kriegner, Dominik

Subjects: nano-focus; nanowire; strain analysis

• Source: Journal of Synchrotron Radiation

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Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction

• Authors : Arman Davtyan; Steven J. Leake; Ullrich Pietsch ...

Subjects: Diffraction; Nuclear and High Energy Physics; Electron density

• Source: Journal of Synchrotron Radiation'Journal of Synchrotron Radiation ', vol: 24, pages: 981-990 (2017)

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X-ray diffraction strain analysis of a single axial InAs 1-x Px nanowire segment.

• Authors : Keplinger M; Solid State and Semiconductor Physics, Johannes Kepler University Linz, A-4040 Linz, Austria.; Mandl B

• Source: Journal of synchrotron radiation [J Synchrotron Radiat] 2015 Jan; Vol. 22 (1), pp. 59-66. Date of Electronic Publication: 2015 Jan 01.Publisher: Wiley Online Library Country of Publication: United States NLM ID: 9888878 Publication Model: Print-Electronic Cited Medium: Internet

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Beam damage of single semiconductor nanowires during X-ray nanobeam diffraction experiments

• Authors : Florian Bertram; Taseer Anjum; Arka Bikash Dey

Subjects: Nuclear and High Energy Physics; Materials science; air and He atmosphere

• Source: Journal of Synchrotron RadiationJournal of synchrotron radiation 27(5), 1200-1208 (2020). doi:10.1107/S1600577520009789

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Perspectives and limitations of symmetric X-ray Bragg reflections for inspecting polytypism in nanowires

• Authors : Philipp Schroth; Martin Köhl; Tilo Baumbach

Subjects: Diffraction; Nuclear and High Energy Physics; Radiation

• Source: Journal of Synchrotron Radiation. 23:487-500

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KB scanning of X-ray beam for Laue microdiffraction on accelero-phobic samples: application to in situ mechanically loaded nanowires

• Authors : Anton Davydok; Gunther Richter; Cédric Leclere

Subjects: 010302 applied physics; In situ; Nuclear and High Energy Physics

• Source: Journal of synchrotron radiation. 23(Pt 6)

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