نتائج البحث

Using photoelectron spectroscopy to measure resonant inelastic X‐ray scattering: a computational investigation.

• Authors : Higley, Daniel J.; Ogasawara, Hirohito; Zohar, Sioan

Subjects: INELASTIC scattering; PHOTOELECTRON spectroscopy; X-ray scattering

• Source: Journal of Synchrotron Radiation; Jan2022, Vol. 29 Issue 1, p202-213, 12p

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Electronic structure variations of polar and nonpolar ZnO lattices with nitrogen-ion bombardment using synchrotron-basedin situphotoemission and X-ray absorption spectroscopy

• Authors : Rui Wu; Xuebin Yuan; Junyong Kang

Subjects: 010302 applied physics; Nuclear and High Energy Physics; X-ray absorption spectroscopy

• Source: Journal of Synchrotron Radiation. 27:83-89

تفاصيل العنوان

Electronic structure variations of polar and nonpolar ZnO lattices with nitrogen‐ion bombardment using synchrotron‐based in situ photoemission and X‐ray absorption spectroscopy.

• Authors : Huang, Yuyang¹ (AUTHOR); Li, Yaping^1,2 (AUTHOR) ; Wu, Meng¹ (AUTHOR)

• Source: Journal of Synchrotron Radiation. Jan2020, Vol. 27 Issue 1, p83-89. 7p.

تفاصيل العنوان

SR2002 conference.

• Authors : Ankudinov, A. L.¹ ; Rehr, J. J.¹

• Source: Journal of Synchrotron Radiation. Sep2003, Vol. 10 Issue 5, p366. 3p.

تفاصيل العنوان

Using photoelectron spectroscopy to measure resonant inelastic X-ray scattering: a computational investigation

• Authors : Daniel J. Higley; Hirohito Ogasawara; Sioan Zohar

Subjects: resonant inelastic x-ray scattering; photoelectron spectroscopy; deconvolution

• Source: Journal of Synchrotron Radiation, Vol 29, Iss 1, Pp 202-213 (2022)

تفاصيل العنوان

Development of XAFS theory.

• Authors : Ankudinov AL; Department of Physics, Box 351560, University of Washington, Seattle, WA 98195, USA. ; Rehr JJ

Subjects: Models, Chemical* ; Models, Molecular*; Crystallography, X-Ray/Crystallography, X-Ray/Crystallography, X-Ray/*methods

• Source: Journal of synchrotron radiation [J Synchrotron Radiat] 2003 Sep 01; Vol. 10 (Pt 5), pp. 366-8. Date of Electronic Publication: 2003 Aug 28.Publisher: Wiley Online Library Country of Publication: United States NLM ID: 9888878 Publication Model: Print-Electronic Cited Medium: Print ISSN:

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