نتائج البحث

A method for crystallographic mapping of an alpha‐beta titanium alloy with nanometre resolution using scanning precession electron diffraction and open‐source software libraries.

• Authors : MacLaren, Ian¹ (AUTHOR) ; Frutos‐Myro, Enrique^1,2 (AUTHOR); Zeltmann, Steven^3,4 (AUTHOR)

• Source: Journal of Microscopy. Aug2024, Vol. 295 Issue 2, p131-139. 9p.

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EBSD patterns simulating multilayer twins based on dynamical theory of electron diffraction.

• Authors : Li, Xinglin¹ (AUTHOR); Li, Xiangcheng¹ (AUTHOR); Wu, Tao¹ (AUTHOR)

• Source: Journal of Microscopy. Sep2023, Vol. 291 Issue 3, p199-209. 11p.

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Facet type determination based on combined atomic force microscopy and electron backscatter diffraction.

• Authors : Brüning, Ralf¹ (AUTHOR) ; Hajati, Mehrad² (AUTHOR); Lelièvre, Peter G.² (AUTHOR)

• Source: Journal of Microscopy. Apr2023, Vol. 290 Issue 1, p10-22. 13p.

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Local Kikuchi band detection in electron backscatter diffraction patterns for enhanced pattern indexing.

• Authors : Shen, Yitian^1,2 (AUTHOR); Zhang, Yongsheng^1,2 (AUTHOR); Li, Wei³ (AUTHOR)

• Source: Journal of Microscopy. Dec2021, Vol. 284 Issue 3, p256-265. 10p.

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Implications of gnomonic distortion on electron backscatter diffraction and transmission Kikuchi diffraction.

• Authors : Fancher, Chris M.¹ (AUTHOR) ; Burch, Matthew J.² (AUTHOR); Patala, Srikanth² (AUTHOR)

• Source: Journal of Microscopy. Feb2022, Vol. 285 Issue 2, p85-94. 10p.

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Quantitative order‐parameter measurement in lattice‐mismatched AlInP using precession electron diffraction.

• Authors : Pasala, Xavier¹ (AUTHOR); Pokharel, Nikhil¹ (AUTHOR); Ahrenkiel, Phil¹ (AUTHOR)

• Source: Journal of Microscopy. Nov2021, Vol. 284 Issue 2, p132-141. 10p.

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Thickness profiling of electron transparent aluminium alloy foil using convergent beam electron diffraction.

• Authors : Bendo, Artenis¹ (AUTHOR) ; Moshtaghi, Masoud² (AUTHOR); Smith, Matthew¹ (AUTHOR)

• Source: Journal of Microscopy. Oct2022, Vol. 288 Issue 1, p10-15. 6p.

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Compressive electron backscatter diffraction imaging

• Authors : Zoë Broad; Alex W. Robinson; Jack Wells

Subjects: Condensed Matter - Materials Science; Image and Video Processing (eess.IV); FOS: Electrical engineering, electronic engineering, information engineering

• Source: Journal of Microscopy.

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Nanocrystal segmentation in scanning precession electron diffraction data.

• Authors : BERGH, T.¹ (AUTHOR); JOHNSTONE, D.N.² (AUTHOR); CROUT, P.² (AUTHOR)

• Source: Journal of Microscopy. Sep2020, Vol. 279 Issue 3, p158-167. 10p. 4 Diagrams, 2 Graphs.

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A study on the indexing method of the electron backscatter diffraction pattern assisted by the Kikuchi bandwidth.

• Authors : PENG, F.^1,2 (AUTHOR); ZHANG, Y.^1,2 (AUTHOR) ; ZHANG, J.¹ (AUTHOR)

• Source: Journal of Microscopy. Jan2020, Vol. 277 Issue 1, p3-11. 9p. 4 Color Photographs, 2 Black and White Photographs, 1 Illustration, 3 Diagrams, 13 Charts.

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