نتائج البحث

New developments of computer-aided crystallographic analysis in transmission electron microscopy.

• Authors : Zaefferer, Stefan

• Source: Journal of Applied Crystallography. Feb2000, Vol. 33 Issue 1, p10. 16p. 25 Diagrams, 2 Charts, 1 Graph.

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XRPD/TEM studies of model high-temperature shift catalysts.

• Authors : Johnsen, Rune E.^1,2 ; Molenbroek, Alfons M.¹; Ståhl, Kenny²

• Source: Journal of Applied Crystallography. Aug2006, Vol. 39 Issue 4, p519-526. 8p. 4 Black and White Photographs, 3 Charts.

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Estimation of cobalt coasting layer thickness on acicular Fe[sub3]O[sub4] powder using HR-TEM.

• Authors : Sakai, Keitarou; Saguchi, Hiroto; Nishimura, Tadashi

• Source: Journal of Applied Crystallography. Apr2001, Vol. 34 Issue 2, p102. 6p. 6 Black and White Photographs, 1 Chart.

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REW– exit-wave reconstruction and alignments for focus-variation high-resolution transmission electron microscopy images.

• Authors : Lin, F.¹; Chen, Q.¹; Peng, L.-M.¹

• Source: Journal of Applied Crystallography. Jun2007, Vol. 40 Issue 3, p614-614. 1p.

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Use of TEM-EDX for structural formula identification of clay minerals: a case study of Di Linh bentonite, Vietnam

• Authors : Hoang-Minh, Thao; Kasbohm, Jörn; Nguyen-Thanh, Lan

Subjects: clay minerals; Di Linh bentonite; transmission electron microscopy

• Source: Journal of applied crystallography. 52(1):133-147

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REW– exit-wave reconstruction and alignments for focus-variation high-resolution transmission electron microscopy images

• Authors : Qing Chen; Feng Lin; Lian-Mao Peng

Subjects: Conventional transmission electron microscope; Optics; Electron tomography

• Source: Journal of Applied Crystallography. 40:614-614

تفاصيل العنوان

Transmission electron microscopy and diffractometry of materials.By B. Fultz and J. M. Howe. pp. xix + 748pp. Heidelberg: Springer-Verlag, 2001. Price DM 179.00, US $89.95. ISBN 3-540-67841-7

• Authors : Douglas L. Dorset

Subjects: Materials science; Transmission electron microscopy; Analytical chemistry

• Source: Journal of Applied Crystallography. 35:145-146

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New developments of computer-aided crystallographic analysis in transmission electron microscopy

• Authors : Stefan Zaefferer

Subjects: Diffraction; Misorientation; business.industry

• Source: Journal of Applied Crystallography. 33:10-25

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SUePDF: a program to obtain quantitative pair distribution functions from electron diffraction data

• Authors : Tran, Dung Trung; Svensson, Gunnar; Tai, Cheuk-Wai

Subjects: pair distribution functions; electron diffraction; transmission electron microscopy

• Source: Journal of applied crystallography. 50:304-312

تفاصيل العنوان

Transmission electron microscopy and diffractometry of materials (Book).

• Authors : Dorset, Douglas L.

• Source: Journal of Applied Crystallography. Feb2002, Vol. 35 Issue 1, p145. 2p.

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