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Academic Journal

Study of scaling effect of ferroelectric gate stack in planar InGaAs MOSFET.

  • Source: International Journal of Numerical Modelling. Mar2023, Vol. 36 Issue 2, p1-12. 12p.

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Academic Journal

Pseudo Split Gate In0.53Ga0.47As/InP Hetero‐Junction Tunnel FET: Design and Analysis.

  • Source: International Journal of Numerical Modelling. Mar/Apr2021, Vol. 34 Issue 2, p1-11. 11p.

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Academic Journal

RF modeling of 40-nm SOI triple-gate FinFET.

  • Source: International Journal of Numerical Modelling. Jul/Aug2015, Vol. 28 Issue 4, p465-478. 14p.

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