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Conference

Efficient Test of Dynamic Read Destructive Faults in SRAM Memories

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsBahia; Brazil

  • Source: 6th IEEE Latin American Test WorkshopLATW: Latin American Test Workshophttps://hal-lirmm.ccsd.cnrs.fr/lirmm-00106515LATW: Latin American Test Workshop,

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Conference

Efficient Test of Dynamic Read Destructive Faults in SRAM Memories

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsBahia; Brazil

  • Source: 6th IEEE Latin American Test WorkshopLATW: Latin American Test Workshophttps://hal-lirmm.ccsd.cnrs.fr/lirmm-00106515LATW: Latin American Test Workshop,

تفاصيل العنوان

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Conference

Efficient Test of Dynamic Read Destructive Faults in SRAM Memories

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsBahia; Brazil

  • Source: 6th IEEE Latin American Test WorkshopLATW: Latin American Test Workshophttps://hal-lirmm.ccsd.cnrs.fr/lirmm-00106515LATW: Latin American Test Workshop,

تفاصيل العنوان

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