نتائج البحث

Formal Methods for Robustness Checking of Radiation-Hardened-by-Design Microelectronics

• Authors : Gao, Ping [Aries Design Automation, LLC, Chicago, IL (United States)]

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Species interactions differ in their genetic robustness

• Authors : Harcombe, William [Univ. of Minnesota, St. Paul, MN (United States). Dept. of Ecology, Evolution, and Behavior and BioTechnology Inst.]

• Source: Frontiers in Microbiology; 6; C

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Exploring precipitation pattern scaling methodologies and robustness among CMIP5 models

• Authors : Bond-Lamberty, Ben [Pacific Northwest National Lab. (PNNL), College Park, MD (United States)] (ORCID:0000000195254633)

• Source: Geoscientific Model Development (Online); 10; 5

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Examining robustness of model selection with half-normal and LASSO plots for unreplicated factorial designs

• Authors : Anderson-Cook, Christine [Los Alamos National Lab. (LANL), Los Alamos, NM (United States)] (ORCID:0000000201655565)

• Source: Quality and Reliability Engineering International; 33; 8

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Dramatic robustness of a multiple delay dispersed interferometer to spectrograph errors: how mixing delays reduces or cancels wavelength drift

• Authors : Kim, A

• Source: Conference: Presented at: SPIE Astronomical Telescopes and Instrumentation, Edinburgh, United Kingdom, Jun 26 - Jul 01, 2016

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Synthetic photosynthetic consortia define interactions leading to robustness and photoproduction

• Authors : Ducat, Daniel [Michigan State Univ., East Lansing, MI (United States)]

• Source: Journal of Biological Engineering; 11; 1

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Digital System Robustness via Design Constraints: The Lesson of Formal Methods.

• Authors : Hulette, Geoffrey

• Source: Conference: Proposed for presentation at the IEEE International Systems Conference held April 13-16, 2015 in Vancouver, BC, Canada.

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Integrated Process Monitoring based on Systems of Sensors for Enhanced Nuclear Safeguards Sensitivity and Robustness

• Authors : Garcia, Humberto

• Source: Conference: INMM 52st Annual Meeting,Palm Desert, CA,07/17/2011,07/21/2011

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Robustness of magnetic and electric domains against charge carrier doping in multiferroic hexagonal ErMnO 3

• Authors : Meier, D. [ETH Zurich (Netherlands). Dept. of Materials]

• Source: New Journal of Physics; 18; 4

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Digital System Robustness via Design Constraints: The Lesson of Formal Methods.

• Authors : Hulette, Geoffrey

• Source: Conference: Proposed for presentation at the IEEE International Systems Conference held April 13-16, 2015 in Vancouver, BC, Canada.

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