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Authors :
Jones, David [Los Alamos National Lab. (LANL), Los Alamos, NM (United States)]
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Source:
SPIE Proceedings, Optical System Alignment, Tolerancing, and Verification XI, 1037704; 10377; Conference: SPIE Optics+Photonics 2017, San Diego, California, August 6 – August 10, 2017
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تفاصيل العنوان
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Authors :
Englund, D. [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)]
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Source:
Optical Materials Express; 7; 5
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تفاصيل العنوان
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Authors :
Daykin, Edward [National Security Technologies, LLC. (NSTec), Mercury, NV (United States)]
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Source:
Proceedings of the 19th Biennial Conference of the APS Topical Group on Shock Compression of Condensed Matter; 60; 8; Conference: 19th Biennial Conference of the American Physical Society (APS)
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تفاصيل العنوان
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Authors :
Han, Thomas [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)]
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Source:
Advanced Optical Materials; 5; 7
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تفاصيل العنوان
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Authors :
Van, Vien [Univ. of Alberta, Edmonton, AB (Canada). Dept. of Electrical and Computer Engineering] (ORCID:0000000347785725)
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Source:
Journal of Lightwave Technology; 35; 4
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تفاصيل العنوان
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Source:
Conference: NNSA Laboratory Directed Research and Development (LDRD) Symposium, Washington DC, June 9, 2011
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تفاصيل العنوان
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Authors :
Joshi, Pooran [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)]
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Source:
ACS Applied Materials and Interfaces; 8; 3
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تفاصيل العنوان
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Authors :
Jiang, Wei [Rutgers Univ., Piscataway, NJ (United States)]
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Source:
IEEE Photonics Technology Letters; 28; 20
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تفاصيل العنوان
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Authors :
Soukoulis, Costas [Inst. of Electronic Structure and Laster, Crete (Greece); Iowa State Univ., Ames, IA (United States)]
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Source:
Optics Express; 23; 11
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تفاصيل العنوان
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Authors :
Sorenson, Danny [Los Alamos National Lab. (LANL), Los Alamos, NM (United States)]
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Source:
Proc. SPIE 9195, Optical System Alignment, Tolerancing, and Verification VIII, 919503 (8 September 2014); doi: 10.1117/12.2062126; 9195; Conference: SPIE Conference on Radiation Detectors: Systems and
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تفاصيل العنوان
