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Authors :
Ramanathan, Arvind [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)]
تفاصيل العنوان
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Authors :
Theiler, James [Los Alamos National Laboratory]
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Source:
Conference: SPIE Defense Security and Sensing ; April 13, 2009 ; Orlando, FL
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تفاصيل العنوان
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Authors :
Bolme, David [ORNL]
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Source:
Conference: IEEE Winter Conference on Applications of Computer Vision, Waikoloa Beach, HI, USA, 20150106, 20150109
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تفاصيل العنوان
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Authors :
Kinoshita, Robert
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Source:
Conference: Spectrum 2002,Reno, NV,08/04/2002,08/08/2002
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تفاصيل العنوان
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Source:
Conference: Spectrum 2002, Reno, NV (US), 08/04/2002--08/08/2002; Other Information: PBD: 23 May 2002
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تفاصيل العنوان
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Source:
Conference: SPIE technical conference and exhibition on medical imaging, Newport Beach, CA (USA), 4-9 Feb 1990
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تفاصيل العنوان
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Authors :
Messinger, David [Rochester Inst. of Technology, NY (United States). Carlson Center for Imaging Science]
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Source:
Proceedings (Applied Imagery Pattern Recognition Workshop. Online); 2015; Conference: Applied Imagery Pattern Recognition Workshop, Washington, DC (United States), 13-15 Oct 2015; Other Information:
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تفاصيل العنوان
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Authors :
Morrison, Jack [Los Alamos National Laboratory]
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Source:
Conference: SPIE Defense, Security and Sensing ; April 13, 2009 ; Orlando, FL
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تفاصيل العنوان
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Authors :
Theiler, J [James P.]
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Source:
Conference: Submitted to: Optical Science&Technology, SPIE's 49th Annual Meeting, August 2004, Denver, CO
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تفاصيل العنوان