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Academic Journal

Optical STEM detection for scanning electron microscopy

Subjects: Electron detection; Instrumentation development; Scanning electron microscopy

  • Source: Kievits , A J , Duinkerken , B H P , Fermie , J , Lane , R , Giepmans , B N G & Hoogenboom , J P 2024 , ' Optical STEM detection for scanning

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  • 1-10 ل  169,404 نتائج ل ""SCANNING electron microscopy""