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  • 1-10 ل  18 نتائج ل ""Nier, Olivier""

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Content Provider : BASE Publisher : hal ccsd Publisher : journal of universal computer science Subject : 35q92 Subject : [sdv.mhep.mi]life sciences [q-bio]/human health and pathology/infectious diseases Subject : [sdv.mhep]life sciences [q-bio]/human health and pathology Subject : [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics Subject : antibiotique Subject : cancer Subject : cost-effectiveness analysis فلترة بواسطة : مؤلف
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Conference

Effective field and universal mobility in high-k metal gate UTBB-FDSOI devices

Subjects: coefficient η; silicon transistor mobility; FDSOI universal mobilityUdine; Italy

  • Source: 2014 ICMTS Proceedings27th International Conference on Microelectronic Test Structures (ICMTS)https://hal.science/hal-0110247427th International Conference on Microelectronic Test

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Conference

Effective field and universal mobility in high-k metal gate UTBB-FDSOI devices

Subjects: coefficient η; silicon transistor mobility; FDSOI universal mobilityUdine; Italy

  • Source: 2014 ICMTS Proceedings27th International Conference on Microelectronic Test Structures (ICMTS)https://hal.science/hal-0110247427th International Conference on Microelectronic Test

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Conference

Effective field and universal mobility in high-k metal gate UTBB-FDSOI devices

Subjects: coefficient η; silicon transistor mobility; FDSOI universal mobilityUdine; Italy

  • Source: 2014 ICMTS Proceedings27th International Conference on Microelectronic Test Structures (ICMTS)https://hal.science/hal-0110247427th International Conference on Microelectronic Test

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Conference

Effective field and universal mobility in high-k metal gate UTBB-FDSOI devices

Subjects: coefficient η; silicon transistor mobility; FDSOI universal mobilityUdine; Italy

  • Source: 2014 ICMTS Proceedings27th International Conference on Microelectronic Test Structures (ICMTS)https://hal.science/hal-0110247427th International Conference on Microelectronic Test

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Conference

Piezoresistivity in unstrained and strained SOI MOSFETs

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMillbrae; United States

  • Source: 2014 S3S Proceedings2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)https://hal.univ-grenoble-alpes.fr/hal-020613262014 IEEE SOI-3D-Subthreshold

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Conference

Effective field and universal mobility in high-k metal gate UTBB-FDSOI devices

Subjects: coefficient η; silicon transistor mobility; FDSOI universal mobilityUdine; Italy

  • Source: 2014 ICMTS Proceedings27th International Conference on Microelectronic Test Structures (ICMTS)https://hal.science/hal-0110247427th International Conference on Microelectronic Test

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Conference

Effective field and universal mobility in high-k metal gate UTBB-FDSOI devices

Subjects: coefficient η; silicon transistor mobility; FDSOI universal mobilityUdine; Italy

  • Source: 2014 ICMTS Proceedings27th International Conference on Microelectronic Test Structures (ICMTS)https://hal.science/hal-0110247427th International Conference on Microelectronic Test

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Conference

Effective field and universal mobility in high-k metal gate UTBB-FDSOI devices

Subjects: FDSOI universal mobility; effective field; coefficient ηUdine; Italy

  • Source: 2014 ICMTS Proceedings27th International Conference on Microelectronic Test Structures (ICMTS)https://hal.archives-ouvertes.fr/hal-0110247427th International Conference on

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Academic Journal

Multi-scale strategy for high-k/metal-gate UTBB-FDSOI devices modeling with emphasis on back bias impact on mobility

Subjects: Split C-V mobility measurements; UTBB-FDSOI devices; Multi-scale simulations

  • Source: ISSN: 1569-8025.

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Academic Journal

Multi-scale strategy for high-k/metal-gate UTBB-FDSOI devices modeling with emphasis on back bias impact on mobility

Subjects: Split C-V mobility measurements; UTBB-FDSOI devices; Multi-scale simulations

  • Source: ISSN: 1569-8025.

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  • 1-10 ل  18 نتائج ل ""Nier, Olivier""