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Conference

A universal spintronic technology based on Multifunctional Standardized Stack

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsGrenoble; France

  • Source: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)DATE 2020 - 23rd Design, Automation and Test in Europe Conference and Exhibitionhttps://hal.science/hal-03753403

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Conference

A universal spintronic technology based on Multifunctional Standardized Stack

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsGrenoble; France

  • Source: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)DATE 2020 - 23rd Design, Automation and Test in Europe Conference and Exhibitionhttps://hal.science/hal-03753403

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Conference

A universal spintronic technology based on Multifunctional Standardized Stack

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsGrenoble; France

  • Source: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)DATE 2020 - 23rd Design, Automation and Test in Europe Conference and Exhibitionhttps://hal.science/hal-03753403

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Conference

A universal spintronic technology based on Multifunctional Standardized Stack

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsGrenoble; France

  • Source: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)DATE 2020 - 23rd Design, Automation and Test in Europe Conference and Exhibitionhttps://hal.science/hal-03753403

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Conference

A universal spintronic technology based on Multifunctional Standardized Stack

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsGrenoble; France

  • Source: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)DATE 2020 - 23rd Design, Automation and Test in Europe Conference and Exhibitionhttps://hal.science/hal-03753403

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Conference

COMFOR: a universal extractor [VLSI design]

Subjects: description-generation; CAD; device-recognition-problemToulouse; France

  • Source: 11th European Solid State Circuits Conference (ESSCIRC'85)https://hal.science/hal-0001332711th European Solid State Circuits Conference (ESSCIRC'85), Sep 1985, Toulouse,

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Conference

COMFOR: a universal extractor [VLSI design]

Subjects: description-generation; CAD; device-recognition-problemToulouse; France

  • Source: 11th European Solid State Circuits Conference (ESSCIRC'85)https://hal.archives-ouvertes.fr/hal-0001332711th European Solid State Circuits Conference (ESSCIRC'85), Sep 1985, Toulouse,

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Conference

Random Adjacent Sequences: An Efficient Solution for Logic BIST

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

  • Source: 11th International Conference on Very Large Scale Integration of Systems-on/ChipVLSI-SoC: Very Large Scale Integration - System-on-Chiphttps://hal-lirmm.ccsd.cnrs.fr/lirmm-00345802

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