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Out-of-plane surface patterning by subsurface processing of polymer substrates with focused ion beams

• Authors : Chiriaev, Serguei; Tavares, Luciana; Adashkevich, Vadzim

• Source: Chiriaev , S , Tavares , L , Adashkevich , V , Goszczak , A J & Rubahn , H-G 2020 , ' Out-of-plane surface patterning by subsurface processing of polymer substrates with focused

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Investigating ripple pattern formation and damage profiles in Si and Ge induced by 100 keV Ar+ ion beam:a comparative study

• Authors : Sulania, Indra; Sondhi, Harpreet; Kumar, Tanuj

Subjects: atomic force microscopy; ion beam; nanopatterns

• Source: Sulania , I , Sondhi , H , Kumar , T , Ojha , S , Umapathy , G R , Mishra , A , Tripathi , A , Krishna , R , Avasthi , D K & Mishra , Y K 2024 , ' Investigating ripple pattern formation and damage

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Helium Ion Microscopy and Sectioning of Spider Silk

• Authors : Iachina, Irina; Brewer, Jonathan; Rubahn, Horst-Gunter

Subjects: Microscopy; Helium-Ion Microsocpy; Spider Silk

• Source: Iachina , I , Brewer , J , Rubahn , H-G & Fiutowski , J 2023 , ' Helium Ion Microscopy and Sectioning of Spider Silk ' , Scanning , vol. 2023 , 2936788 .

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Lethal DNA damage caused by ion-induced shock waves in cells

• Authors : Friis, Ida; Verkhovtsev, Alexey V.; Solov'Yov, Ilia A.

Subjects: DNA; DNA Damage; DNA Repair

• Source: Friis , I , Verkhovtsev , A V , Solov'Yov , I A & Solov'Yov , A V 2021 , ' Lethal DNA damage caused by ion-induced shock waves in cells ' , Physical Review E , vol. 104

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Height patterning of nanostructured surfaces with a focused helium ion beam:a precise and gentle non-sputtering method

• Authors : Tavares, L.; Chiriaev, S.; Adashkevich, V.

• Source: Tavares , L , Chiriaev , S , Adashkevich , V , Taboryski , R & Rubahn , H G 2020 , ' Height patterning of nanostructured surfaces with a focused helium ion beam : a

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