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Conference

Développement technologique d'un HEMT normally-off avec une grille à barrière P-GaN

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

  • Source: Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM) ; https://laas.hal.science/hal-02278808 ; Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM), Jun

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Conference

Matrice de Butler 3D compacte et large bande pour applications 5G

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [SPI.ELEC]Engineering Sciences [physics]/ElectromagnetismMontpellier; France

  • Source: Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM 2019) ; https://laas.hal.science/hal-03058268 ; Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM 2019), Jun

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Conference

Optimisation des techniques de microfabrication sur diamant

Subjects: [SHS]Humanities and Social Sciences; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [SPI.MAT]Engineering Sciences [physics]/MaterialsMontpellier; France

  • Source: Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2019) ; https://shs.hal.science/halshs-02329822 ; Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM

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Conference

Gate defects in AlGaN/GaN HEMTs revealed by low frequency noise measurements

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

  • Source: 2013 22nd International Conference on Noise and Fluctuations (ICNF),22nd International Conference on Noise and Fluctuations (ICNF 2013)https://hal.science/hal-0134342622nd

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Conference

Gate and drain low frequency noise of ALGaN/GaN HEMTs featuring high and low gate leakage currents

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

  • Source: 22nd International Conference on Noise and Fluctuations (ICNF 2013)https://hal.science/hal-0134342922nd International Conference on Noise and Fluctuations (ICNF 2013), Jun 2013,

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