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Dissertation/ Thesis

Characterization and modelling of MOS transistors from advanced technologies (FDSOI, nanowire, GaN HEMT, LTPS…) ; Caractérisation et modélisation des composants MOS des technologies avancées (FDSOI, nanofil, GaN HEMT, LTPS…)

Subjects: Charactertization; Microelectronics; Mosfet

  • Source: https://theses.hal.science/tel-04531810 ; Micro and nanotechnologies/Microelectronics. Université Grenoble Alpes [2020-.]; Koryŏ taehakkyo. Asea munje yŏn’guso (Séoul, Corée S.), 2023.

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Conference

A microcontroller based wall shear stress measurement

Subjects: MEMS; sensor data acquisition; wall shear stress sensorAjaccio; France

  • Source: IEEE International Symposium on Industrial Electronics ; https://hal.science/hal-00262264 ; IEEE International Symposium on Industrial Electronics, May 2004, Ajaccio, France.

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  • 1-10 of  12 نتائج ل ""Polycrystalline silicon""