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Conference

Resiliency Approaches in Convolutional, Photonic, and Spiking Neural Networks

Subjects: Convolutional Neural Networks; Spiking Neural Networks; Photonic Neural NetworksBrazilMaceio, Brazil

  • Source: IEEE Latin American Test Symposium (LATS 2024) ; https://hal.science/hal-04564652 ; IEEE Latin American Test Symposium (LATS 2024), Apr 2024, Maceio, Brazil ; https://cas.polito.it/LATS2024/

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Conference

Enhancing side-channel attacks through X-ray-induced leakage amplification

Subjects: CPA; leakage; side-channelValence; SpainValence, Spain

  • Source: Proceedings ; DATE 24 - Design, Automation and Test in Europe Conference ; https://hal.science/hal-04510854 ; DATE 24 - Design, Automation and Test in Europe Conference, Mar 2024, Valence, Spain ;

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Conference

Choose your Path: Control of Ring Oscillators EMFI Susceptibility through FPGA P&R Constraints

Subjects: EMFI; FPGA; ring oscillator (RO)Kielce; PolandKielce, Poland

  • Source: International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2024) ; https://hal.science/hal-04513560 ; International Symposium on Design and Diagnostics of Electronic

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Conference

Harmonic Response of Ring Oscillators under Single ElectroMagnetic Pulsed Fault Injection

Subjects: EMFI; FPGA security; harmonic lockingBrazilMaceio (Brazil), Brazil

  • Source: 25th IEEE Latin American Test Symposium (LATS 2024)https://hal.science/hal-0451358525th IEEE Latin American Test Symposium (LATS 2024), Apr 2024, Maceio (Brazil), BrazilIEEELink

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Conference

Modeling Thermal Effects For Biasing PUFs

Subjects: PACS 85.42; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsThe Hague; Netherlands

  • Source: 29th IEEE European Test Symposium (ETS 2024)https://hal.science/hal-0453256429th IEEE European Test Symposium (ETS 2024), May 2024, The Hague, NetherlandsIEEELink

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Book

Inside the AI Accelerators: From High Performance to Energy Efficiency

Subjects: CPU; hardware accelerator; deep learning

  • Source: Advancing Edge Artificial Intelligence ; https://hal.science/hal-04465853 ; Ovidiu VERMESAN - Dave MARPLES. Advancing Edge Artificial Intelligence, River Publishers, pp.87-103, 2024, 9781003478713.

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Conference

fT extraction of HEMT transistors at mm-waves through EM-simulated de-embedding devices

Subjects: CMOS; cut-off frequency (fT); de-embeddingSan Antonio (TX); United StatesSan Antonio (TX), United States

  • Source: IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2024) ; https://hal.science/hal-04487746 ; IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits

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Conference

Fault Analysis for a MTJ-based Spiking Neural Network

Subjects: open defects; spiking neural network; fault analysisBrazilMaceio, Brazil

  • Source: 25th IEEE Latin American Test Symposium (LATS 2024)https://hal.science/hal-0452702525th IEEE Latin American Test Symposium (LATS 2024), Apr 2024, Maceio, Brazil

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Conference

Study of a Spintronic-based STDP-trained SNN under Fabrication-induced Process Variability

Subjects: PACS 85.42; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsBrazilMaceio, Brazil

  • Source: IEEE Latin American Test Symposium (LATS 2024) ; https://hal.science/hal-04527044 ; IEEE Latin American Test Symposium (LATS 2024), Apr 2024, Maceio, Brazil

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