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Collection : Universite Grenoble Alpes Subject : mosfet

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Dissertation/ Thesis

Characterization and modelling of MOS transistors from advanced technologies (FDSOI, nanowire, GaN HEMT, LTPS…) ; Caractérisation et modélisation des composants MOS des technologies avancées (FDSOI, nanofil, GaN HEMT, LTPS…)

Authors : Kim, Donghyun;

Subjects: Charactertization; Microelectronics; Mosfet

Source: https://theses.hal.science/tel-04531810 ; Micro and nanotechnologies/Microelectronics. Université Grenoble Alpes [2020-.]; Koryŏ taehakkyo. Asea munje yŏn’guso (Séoul, Corée S.), 2023.

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