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Conference

Autofocus in infrared microscopy

Subjects: Infrared imaging; Microscopy; FocusingTurin; France

  • Source: 2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA)https://amu.hal.science/hal-020608282018 IEEE 23rd International Conference on Emerging

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Academic Journal

Spatial Location in Integrated Circuits through Infrared Microscopy

Subjects: thermal imaging; microscopy; secure characterization

  • Source: ISSN: 1424-8220 ; Sensors ; https://amu.hal.science/hal-03225649 ; Sensors, 2021, 21 (6), pp.2175. ⟨10.3390/s21062175⟩.

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Conference

The power spectrum extended technique applied to images of binary stars in the infrared

Subjects: Lucky imaging; speckle; Post adaptive-optics imagingOnline Only; France

  • Source: Adaptive Optics Systems VII ; https://hal.science/hal-03071661 ; Adaptive Optics Systems VII, Dec 2020, Online Only, France. pp.123, ⟨10.1117/12.2560453⟩

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