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Conference

CAPC: A Configurable Analog Pop-Count Circuit for Near-Memory Binary Neural Networks

Subjects: BNN; Analog Pop-Count; Near-MemoryLansing; France

  • Source: 2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)https://hal.science/hal-036249222021 IEEE

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Conference

Benchmarking and optimization of trench-based multi-gate transistors in a 40 nm non-volatile memory technology

Subjects: Multi-gate; Triple gate transistor; Dual gate transistorMontpellier; France

  • Source: 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)https://hal.science/hal-035023602021 16th International Conference on Design &

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Conference

Energy-Efficient Bayesian Inference Using Near-Memory Computation with Memristors

Subjects: memristor ASIC Bayesian inference; memristor; ASICAntwerp; Belgium

  • Source: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)https://cnrs.hal.science/hal-042705632023 Design, Automation & Test in Europe Conference & Exhibition (DATE), Apr

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Conference

Experimental Demonstration of Memristor Delay-Based Logic In-Memory Ternary Neural Network

Subjects: [SPI]Engineering Sciences [physics]Kyoto; JapanKyoto, Japan

  • Source: 2023 Silicon Nanoelectronics Workshop (SNW)https://cnrs.hal.science/hal-042703962023 Silicon Nanoelectronics Workshop (SNW), Jun 2023, Kyoto, Japan. pp.43-44,

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Conference

SuperCAST: a full free addressable memory array

Subjects: CAST non-volatile memories array; CAST; non-volatile memoriesCleveland; OH; United States

  • Source: IEEE 34th International Conference on Microelectronic Test Structures (ICMTS 2022) ; https://hal.science/hal-04063478 ; IEEE 34th

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Conference

Embedded measurement of the SET switching time of RRAM memory cells

Subjects: RRAM Switching Time Write termination Timeto-Digital Converter; RRAM; Switching TimeOnline; France

  • Source: 34 TH INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS)https://amu.hal.science/hal-0397104934 TH INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS), Mar

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