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Collection : Universite De Rennes 1
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Academic Journal

Influence of the gate bias stress on the stability of n-type organic field-effect transistors based on dicyanovinylene-dihydroindenofluorene semiconductors

Subjects: Insulator Charge Trapping; Gate Bias Stress; Dicyanovinylene-Dihydroindenofluorene

  • Source: ISSN: 2052-1537 ; Materials Chemistry Frontiers ; https://univ-rennes.hal.science/hal-01881024 ; Materials Chemistry Frontiers, 2018, 2 (9), pp.1631-1641. ⟨10.1039/c8qm00193f⟩.

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Dissertation/ Thesis

N-type OTFTs based on π-conjugated semiconductors : elaboration, performance and stability ; OTFTs de type N à base de semiconducteurs π-conjugués : fabrication, performance et stabilité

Subjects: Organic semiconductors; Thermal evaporation; Organic field effect transistors

  • Source: https://theses.hal.science/tel-01315195 ; Electronique. Université de Rennes, 2015. Français. ⟨NNT : 2015REN1S105⟩.

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  • 1-2 ل  2 نتائج ل ""stress measurements""