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Conference

Reliability and Performance Evaluation of a RISC-V Vector Extension Unit for Vector Multiplication

Subjects: RISC-V; System-on-Chip; Vector InstructionsOxfordshire; United Kingdom

  • Source: 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systemshttps://hal.science/hal-0471540537th IEEE International Symposium on Defect and Fault

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Book

Test and Reliability of Approximate Hardware

Subjects: Approximate computing; Test; Reliability

  • Source: Approximate Computing ; https://inria.hal.science/hal-03888016 ; Approximate Computing, Springer International Publishing, pp.233-266, 2022, ⟨10.1007/978-3-030-98347-5_10⟩

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Conference

Reliability Analysis of a Low-Cost CCSDS 123 Hyperspectral Image Compressor

Subjects: Systems-on-Chip; Hardware Accelerator; Hyperspectral ImagesOxfordshire; United Kingdom

  • Source: 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systemshttps://hal.science/hal-0471540737th IEEE International Symposium on Defect and Fault

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Conference

Reliability of earthworm data from citizen science: Lessons from 8 years of a French National monitoring protocol.

Subjects: [SDE.BE]Environmental Sciences/Biodiversity and EcologyCape Town; South AfricaCape Town, South Africa

  • Source: XIX International Colloquium on Soil Zoology ICSZ ; https://hal.inrae.fr/hal-04672431 ; XIX International Colloquium on Soil Zoology ICSZ, Aug 2024, Cape Town, South Africa. 2024

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Conference

Implementation and Reliability Evaluation of a ChaCha20 Stream Cipher Hardware Accelerator

Subjects: Cryptography RFC 8439 Hardware Acceleration Fault Tolerance; Cryptography; RFC 8439Oxfordshire; United Kingdom

  • Source: 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systemshttps://hal.science/hal-0471540837th IEEE International Symposium on Defect and Fault

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Academic Journal

Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks

Subjects: Approximate methods; Fault injection; Radiation effects

  • Source: ISSN: 2168-6750 ; IEEE Transactions on Emerging Topics in Computing ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03382380 ; IEEE Transactions on Emerging Topics in Computing, 2022, 10 (4), pp.1867-1882.

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Conference

Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks

Subjects: Reliability; Fault Injection; Neural NetworksPunta del Este; Uruguay

  • Source: LATS 2021 - IEEE 22nd Latin American Test Symposium ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03435567 ; LATS 2021 - IEEE 22nd Latin American Test Symposium, Oct 2021, Punta del Este, Uruguay. pp.1-5,

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Conference

Emerging Computing Devices: Challenges and Opportunities for Test and Reliability

Subjects: Emerging Computing Paradigm; Quantum Computing; Approximate ComputingBruges; Belgium

  • Source: ETS 2021 - 26th IEEE European Test Symposium ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03379074 ; ETS 2021 - 26th IEEE European Test Symposium, May 2021, Bruges, Belgium. pp.1-10,

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