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Advancing the application of atomic force microscopy (AFM) to the characterization and quantification of geological material properties

• Authors : Wang, Ke; Ma, Lin; Taylor, Kevin

• Source: Wang , K , Ma , L & Taylor , K 2021 , ' Advancing the application of atomic force microscopy (AFM) to the

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Crystal growth of the core and rotated epitaxial shell of a heterometallic metal-organic framework revealed with atomic force microscopy

• Authors : Attfield, Martin; Anderson, Michael; Pambudi, Fajar

• Source: Attfield , M , Anderson , M & Pambudi , F 2021 , ' Crystal growth of the core and rotated epitaxial shell of a heterometallic metal-organic framework revealed with

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Mechanistic Insights into Diblock Copolymer Nanoparticle–Crystal Interactions Revealed via in Situ Atomic Force Microscopy

• Authors : Hendley IV, Coit T.; Fielding, Lee A.; Jones, Elizabeth. R.

• Source: Hendley IV , C T , Fielding , L A , Jones , E R , Ryan , A J , Armes , S P & Estroff , L A 2018 , ' Mechanistic Insights into Diblock Copolymer Nanoparticle–Crystal Interactions Revealed via in Situ

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Anodic dissolution growth of metal-organic framework HKUST-1 monitored via in situ electrochemical atomic force microscopy

• Authors : Worrall, Stephen D.; Bissett, Mark A.; Attfield, Martin P.

Subjects: ResearchInstitutes_Networks_Beacons/national_graphene_institute; name=National Graphene Institute

• Source: Worrall , S D , Bissett , M A , Attfield , M P & Dryfe , R A W 2018 , ' Anodic dissolution growth of metal-organic framework HKUST-1 monitored via in situ electrochemical

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Determination of PMMA Residues on a Chemical-Vapor-Deposited Monolayer of Graphene by Neutron Reflection and Atomic Force Microscopy

• Authors : Li, Ruiheng; Li, Zongyi; Pambou, Elias

• Source: Li , R , Li , Z , Pambou , E , Gutfreund , P , Waigh , T , Webster , J R P & Lu , J 2018 , ' Determination of PMMA Residues on a Chemical-Vapor-Deposited Monolayer of Graphene by Neutron Reflection

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Insight and control of the crystal growth of zeolitic imidazolate framework ZIF-67 by atomic force microscopy and mass spectrometry

• Authors : Wagia, Raghidah; Strashnov, Ilya; Anderson, Michael

Subjects: crystal structure; crystallization; crystals

• Source: Wagia , R , Strashnov , I , Anderson , M & Attfield , M 2018 , ' Insight and control of the crystal growth of zeolitic imidazolate framework ZIF-67 by atomic

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Frequency-modulated atomic force microscopy localises viscoelastic remodelling in the ageing sheep aorta

• Authors : Akhtar, R; Graham, Helen; Derby, Brian

Subjects: Frequency-modulated atomic force; microscopy; aorta

• Source: Akhtar , R , Graham , H , Derby , B , Sherratt , M , Trafford , A , Chadwick , R & Gavara , N 2016 , ' Frequency-modulated atomic force

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AC and DC electrical imaging of biosamples at the nanoscale by Atomic Force Microscopy

• Authors : Casuso, I.; Fumagalli, L.; Ferrari, G.

• Source: Casuso , I , Fumagalli , L , Ferrari , G , Sampietro , M , Padrós , E , Samitier , J & Gomila , G 2007 , ' AC and DC electrical imaging of biosamples at the nanoscale by

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Improved Graphene Blisters by Ultrahigh Pressure Sealing

• Authors : Manzanares-Negro, Yolanda; Ares, Pablo; Jaafar, Miriam

Subjects: Graphene; Atomic Force Microscopy (AFM); Ultrahigh pressure

• Source: Manzanares-Negro , Y , Ares , P , Jaafar , M , López-Polín , G , Gómez-Navarro , C & Gómez-Herrero , J 2020 , ' Improved Graphene Blisters by Ultrahigh Pressure Sealing ' , ACS Applied Materials

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Tunable Graphene Electronics with Local Ultrahigh Pressure

• Authors : Ares, Pablo; Pisarra, Michele; Segovia, Pilar

Subjects: atomic force microscopy; chemical bonding; doping

• Source: Ares , P , Pisarra , M , Segovia , P , Díaz , C , Martín , F , Michel , E G , Zamora , F , Gómez-Navarro , C & Gómez-Herrero , J 2019 , ' Tunable Graphene Electronics with Local Ultrahigh Pressure

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