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Conference

TEM characterization of BN films grown on metallic substrates by CVD

Subjects: ELECTRON MICROSCOPY; BORON NITRIDE; GROWTHSydney; Australia

  • Source: 19th International Microscopy Congress (ICM19)https://hal.science/hal-0199385819th International Microscopy Congress (ICM19), Sep 2018, Sydney, Australiahttp://imc19.com/

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  • 1-10 of  11 نتائج ل ""Plaud, Alexandre""