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SEM fractography of a porous SiC (nEOI) ; Fractographie MEB d'un SiC poreux (nEOI)

Subjects: Edge-On-Impact; notched-Edge-On-Impact; Scanning Electron Microscopy SEMSaint-Martin-d'Hères; France

  • Source: https://hal.science/hal-02714216 ; Photography. Laboratoire 3SR (Sols, Solides, Structures - Risques), Saint-Martin-d'Hères, France. 2020.

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Image

Mission au Semrev

Subjects: optimism; sem-rev; locean

  • Source: https://media.hal.science/medihal-00665682 ; Photography. http://optimism.locean-ipsl.upmc.fr, France. 2011.

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Image

Mission au Sem Rev

Subjects: optimism; sem-rev; locean

  • Source: https://media.hal.science/medihal-00665684 ; Photography. http://optimism.locean-ipsl.upmc.fr, France. 2011.

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