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Conference

Characterization of a RISC-V System-on-Chip under Neutron Radiation

Authors : Almeida dos Santos, Douglas; Matana Luza, Lucas; Kastriotou, Maria ...

Subjects: RISC-V; System-on-Chip; Fault ToleranceMontpellier; France

Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03357515 ; DTIS 2021 - 16th International Conference on

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Conference

Design and Evaluation of Implementation Impact on a Fault-Tolerant Network-on-Chip Router

Authors : Rossi de Melo, Douglas; Zeferino, Cesar Albenes; Bezerra, Eduardo Augusto ...

Subjects: SoC; NoC; Fault ToleranceMontpellier; France

Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03358975 ; DTIS 2021 - 16th International Conference on

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Conference

Preliminary Defect Analysis of 8T SRAM Cells for In-Memory Computing Architectures

Authors : Ammoura, Lila; Flottes, Marie-Lise; Girard, Patrick ...

Subjects: 8T SRAM cell; In-Memory Computing; testMontpellier; France

Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03377433 ; DTIS 2021 - 16th International Conference on

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Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study

Authors : Matana Luza, Lucas; Söderström, Daniel; Mattos, André Martins Pio De ...

Subjects: Neutrons; Radiation Effects; SDRAMMontpellier; France

Source: DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03357444 ; DTIS 2021 - 16th International Conference on

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Conference

Toward New Era of Computing: From Devices to Applications

Authors : Todri-Sanial, Aida;

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier (virtual); France

Source: What’s next in Computing ? ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025126 ; What’s next in Computing ?, Jul 2020, Montpellier (virtual), France ;

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Conference

Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash

Authors : Gupta, Viyas; Bosser, Alexandre Louis; Matana Luza, Lucas ...

Subjects: Radiation testing; heavy-ion; NAND FlashMontpellier; France

Source: RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03358989 ; RADECS 2019 - 19th European Conference on Radiation and

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Conference

Stuck and Weakened Bits in SDRAM from a Heavy-Ion Microbeam

Authors : Söderström, Daniel; Matana Luza, Lucas; Bosser, Alexandre ...

Subjects: Microbeam; Radiation effects; SDRAMMontpellier; France

Source: RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03359010 ; RADECS 2019 - 19th European Conference on Radiation and

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Conference

Self-robust Non-Volatile C-element for single event upset enhanced tolerance

Authors : Coi, Odilia; Torres, Lionel; Di Pendina, Gregory ...

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

Source: RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-02957093 ; RADECS 2019 - 19th European Conference on Radiation and

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Conference

The use of ensemble methods for indirect test of RF circuits

Authors : El Badawi, Hassan; Azaïs, Florence; Bernard, Serge ...

Subjects: indirect testing; RF integrated circuits; machine-learning algorithmsMontpellier; France

Source: 13e Colloque National du GDR SOC²https://hal-lirmm.ccsd.cnrs.fr/lirmm-0237590013e Colloque National du GDR SOC², Jun 2019, Montpellier, France

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Conference

Evaluation of embedded STT-MRAM for Ultra Low Power applications

Authors : Patrigeon, Guillaume; Benoit, Pascal; Torres, Lionel ...

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMontpellier; France

Source: 13e Colloque National du GDR SoC²https://hal-lirmm.ccsd.cnrs.fr/lirmm-0237970313e Colloque National du GDR SoC², Jun 2019, Montpellier, France. , 2019

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فلترة النتائج

Characterization of a RISC-V System-on-Chip under Neutron Radiation

Design and Evaluation of Implementation Impact on a Fault-Tolerant Network-on-Chip Router

Preliminary Defect Analysis of 8T SRAM Cells for In-Memory Computing Architectures

Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study

Toward New Era of Computing: From Devices to Applications

Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash

Stuck and Weakened Bits in SDRAM from a Heavy-Ion Microbeam

Self-robust Non-Volatile C-element for single event upset enhanced tolerance

The use of ensemble methods for indirect test of RF circuits

Evaluation of embedded STT-MRAM for Ultra Low Power applications

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