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  • 1-6 ل  6 نتائج ل ""Universal""

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Collection : Lirmm Content Provider : BASE Publisher : hal ccsd Publisher : journal of universal computer science Subject : 35q92 Subject : [sdv.mhep.mi]life sciences [q-bio]/human health and pathology/infectious diseases Subject : [sdv.mhep]life sciences [q-bio]/human health and pathology Subject : [spi.nano]engineering sciences [physics]/micro and nanotechnologies/microelectronics Subject : antibiotique Subject : cancer Subject : cost-effectiveness analysis
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Conference

A universal spintronic technology based on Multifunctional Standardized Stack

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsGrenoble; France

  • Source: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)DATE 2020 - 23rd Design, Automation and Test in Europe Conference and Exhibitionhttps://hal.science/hal-03753403

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Book

Random Adjacent Sequences: An Efficient Solution for Logic BIST

Subjects: BIST; Stuck-at Fault; Bridging Fault

  • Source: SOC Design Methodologies ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00345802 ; SOC Design Methodologies, 90, Kluwer, pp.413-424, 2002, IFIP — The International Federation for Information Processing,

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Academic Journal

Non-Volatile Latch Designs with Node-Upset Tolerance and Recovery using Magnetic Tunnel Junctions and CMOS

Subjects: MTJ; Fault tolerance; Radiation hardening

  • Source: ISSN: 1063-8210 ; IEEE Transactions on Very Large Scale Integration (VLSI) Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239391 ; IEEE Transactions on Very Large Scale Integration (VLSI)

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Conference

EVM measurement of RF ZigBee transceivers using standard digital ATE

Subjects: RF test; digital ATE; EVM measurementFrascati; Italy

  • Source: DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03000882 ; DFT 2020 - 33rd IEEE International

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Academic Journal

Addressing the Thermal Issues of STT-MRAM From Compact Modeling to Design Techniques

Subjects: Magnetic tunnel junction (MTJ); STT-MRAM; Read reliability

  • Source: ISSN: 1536-125X ; IEEE Transactions on Nanotechnology ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-01880065 ; IEEE Transactions on Nanotechnology, 2018, 17 (2), pp.345-352.

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Conference

Quantitative evaluation of reliability and performance for STT-MRAM

Subjects: Transistors; Magnetic tunneling; Error analysisMontréal; QCMontréal, QC, Canada

  • Source: 49th International Symposium of Circuits and SystemsISCAS: International Symposium on Circuits and Systemshttps://hal-lirmm.ccsd.cnrs.fr/lirmm-01446275ISCAS: International Symposium

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  • 1-6 ل  6 نتائج ل ""Universal""