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  • 1-8 ل  8 نتائج ل ""Noise measurement""

فلترة النتائج

Collection : Lilloa (Hal Lille Open Archive, Universite De Lille)
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Academic Journal

Comparison of Impedance Matching Networks for Scanning Microwave Microscopy

Subjects: Impedance; Impedance Matching; Scanning Microwave Microscopy

  • Source: ISSN: 0018-9456 ; IEEE Transactions on Instrumentation and Measurement ; https://hal.science/hal-04779337 ; IEEE Transactions on Instrumentation and

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Academic Journal

Comparison of Impedance Matching Networks for Scanning Microwave Microscopy

Subjects: Gain measurement; impedance; impedance matching

  • Source: ISSN: 0018-9456 ; IEEE Transactions on Instrumentation and Measurement ; https://hal.science/hal-04777082 ; IEEE Transactions on Instrumentation and

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Academic Journal

Acoustic noise levels and field distribution in 7 T MRI scanners

Subjects: magnetic resonance imaging; acoustics; noise measurement

  • Source: ISSN: 2296-424X ; Frontiers in Physics ; https://hal.science/hal-04302825 ; Frontiers in Physics, 2023, 11, ⟨10.3389/fphy.2023.1284659⟩.

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Dissertation/ Thesis

Development of characterization benches for noise measurement and power detection between 130 GHz and 320 GHz ; Développement de bancs de caractérisation pour la mesure de bruit et la détection de puissance entre 130 GHz et 320 GHz

Subjects: Complex circuits; Récepteur de bruit; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

  • Source: https://theses.hal.science/tel-03611229 ; Micro et nanotechnologies/Microélectronique. Université de Lille, 2019. Français. ⟨NNT : 2019LILUI116⟩.

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Conference

A second order sliding mode differentiator with a variable exponent

Subjects: Differentiator; Noise measurement; Pollution measurementSeattle; WA; United States

  • Source: ACC 2017 - IEEE American Control Conference ; https://hal.science/hal-01561531 ; ACC 2017 - IEEE American Control Conference, IEEEE, May 2017, Seattle, WA,, United States.

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Academic Journal

DIC Challenge 2.0: Developing Images and Guidelines for Evaluating Accuracy and Resolution of 2D Analyses Focus on the Metrological Efficiency Indicator

Subjects: Digital Image Correlation; DIC; DIC Challenge

  • Source: ISSN: 0039-2103.

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Academic Journal

Dynamic Characterization of III-Nitride-Based High-Speed Photodiodes

Subjects: [SPI]Engineering Sciences [physics]; [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic; [SPI.ACOU]Engineering Sciences [physics]/Acoustics [physics.class-ph]

  • Source: ISSN: 1943-0655 ; IEEE Photonics Journal ; https://uphf.hal.science/hal-03552276 ; IEEE Photonics Journal, 2017, 9 (4), pp.6803006. ⟨10.1109/JPHOT.2017.2714168⟩ ;

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Academic Journal

Fluctuation theorem and microreversibility in a quantum coherent conductor

Subjects: [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat]

  • Source: ISSN: 1098-0121 ; EISSN: 1550-235X.

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  • 1-8 ل  8 نتائج ل ""Noise measurement""