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Conference

Zero-Overhead Nonintrusive Test of mmW Integrated Circuits Based on Wafer-Level Parametric Tests

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsSherbrookeSherbrooke, Canada

  • Source: Proceedings of NEWCAS 2024 ; 2024 22nd IEEE Interregional NEWCAS Conference (NEWCAS) ; https://hal.univ-grenoble-alpes.fr/hal-04734831 ; 2024 22nd IEEE Interregional NEWCAS Conference (NEWCAS), Jun

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Academic Journal

Present and future of micro-transfer printing for heterogeneous photonic integrated circuits

Subjects: [PHYS]Physics [physics]; [SPI]Engineering Sciences [physics]

  • Source: EISSN: 2378-0967 ; APL Photonics ; https://hal.science/hal-04395673 ; APL Photonics, 2024, 9 (1), ⟨10.1063/5.0181099⟩

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Academic Journal

High-Speed Uni-Travelling-Carrier Photodiodes on Silicon Nitride.

Subjects: Silicon photonics; Photomixing; Hybrid integrated circuit

  • Source: EISSN: 2378-0967 ; APL Photonics ; https://hal.science/hal-03917866 ; APL Photonics, 2023, 8 (1), 016104, 6 p. ⟨10.1063/5.0119244⟩

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