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Metadata Extraction Tool and Schema Mapper for Scanning Electron Microscopy (SEM) images

• Authors : Vitali, Elias Giulio Georg; Kirar, Ajay; Joseph, Reetu E.

Subjects: SEM; TIFF; Schema

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Scanning Electron Microscopy (SEM) - Metadata extraction tool and schema mapper

• Authors : Joseph, Reetu Elza; Vitali, Elias Guilio Georg; Aversa, Rossella

Subjects: SEM; TIFF; Schema

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Analysis of Superconducting Thin Films in a Modern FIB/SEM Dual-Beam Instrument

• Authors : Grünewald, Lukas; Nerz, Daniel; Langer, Marco

Subjects: REBCO; GdBCO; STEM-in-SEM

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Metadata schema and mapping service for FIB/SEM serial-sectioning and computed tomography

• Authors : Pauly, Christoph; Joseph, Reetu Elza; Vitali, Elias Giulio Georg

Subjects: tomography; mapping; schema

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Electron-Beam-Induced Carbon Contamination in STEM-in-SEM: Quantification and Mitigation

• Authors : Hugenschmidt, Milena; Adrion, Katharina; Marx, Aaron

Subjects: carbon contamination; quantitative thickness measurement; sample cleaning

• Source: Microscopy and Microanalysis, 29 (1), 219–234 ; ISSN: 1431-9276, 1435-8115

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Image quality evaluation for FIB‐SEM images

• Authors : Roldán, Diego; Redenbach, Claudia; Schladitz, Katja

Subjects: blur; charging artefacts; contrast

• Source: Journal of Microscopy, 293 (2), 98–117 ; ISSN: 0022-2720, 0368-3974, 0962-7375, 1365-2818, 1747-…7-3497, 1747-3500, 2047-1483, 2047-1491, 2047-9751

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Fast Determination of the Thickness of Electron-Transparent Specimens using Quantitative STEM-in-SEM and Monte-Carlo Simulations

• Authors : Adrion, Katharina; Hugenschmidt, Milena; Müller, Erich

Subjects: Electron microscopy; STEM-in-SEM; Thickness Determination

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Ductile shear damage micromechanisms studied by correlative multiscale nanotomography and SEM/EBSD for a recrystallized aluminum alloy 2198 T8

• Authors : Kong, Xiang; Hurst, Mathias; Helfen, Lukas

Subjects: ddc:600; Technology; info:eu-repo/classification/ddc/600

• Source: Journal of Materials Science, 59, 13690–13708 ; ISSN: 0022-2461, 1573-4803

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Repetitive ultramicrotome trimming and SEM imaging for characterizing printed multilayer structures

• Authors : Huang, Liyu; Mach, Tim P.; Binder, Joachim R.

Subjects: ddc:600; Technology; info:eu-repo/classification/ddc/600

• Source: Scientific Reports, 14 (1), Art.-Nr.: 28716 ; ISSN: 2045-2322

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Metadata Extraction Tool and Schema Mapper for Scanning Electron Microscopy (SEM) images

• Authors : Vitali, Elias Giulio Georg; Joseph, Reetu E.; Aversa, Rossella

Subjects: TA-MDI; MatWerk; Data Management Infrastructure

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