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Conference

Reading reliability in 1S1R OTS+PCM devices based on Double-Patterned Self-Aligned structure

Authors : Antonelli, Renzo; Bourgeois, Guillaume; Meli, Valentina ...

Subjects: OTS; PCM; 1S1RParme; Italy

Source: ESREF 2024 - 35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ; https://hal.science/hal-04717271 ; ESREF 2024 - 35th European

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Conference

Human Reliability Assessment method applied to investigate human factors in NDT - The case of the interpretation of radiograms in the French nuclear sector

Authors : Larouzée, Justin; Martin, Etienne; Calmon, Pierre ...

Subjects: Nuclear Power Plant; Inspection; RadiographySheffield - UK; United Kingdom

Source: NDT.net Issue: 2023-07 Special Issue of e-Journal of Nondestructive Testing (eJNDT) ISSN 1435-4934 ; Internatonal conference Non-Destructive Examination (NDE) in Nuclear ;

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Conference

Ultra-fast CV methods (< 10µs) for interface trap spectroscopy and BTI reliability characterization using MOS capacitors

Authors : Mota Frutuoso, Tadeu; Garros, Xavier; Lugo-Alvarez, José ...

Subjects: aging; CMOS technology; DITDallas; United States

Source: IEEE International Reliability Physics Symposium (IRPS 2022) ; https://hal.science/hal-04065065 ; IEEE International Reliability Physics

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Conference

Eco-reliability: A new metric for the eco-design of electronic systems

Authors : Sandionigi, Chiara;

Subjects: [SPI.TRON]Engineering Sciences [physics]/ElectronicsPortland; United States

Source: 2024 IEEE Conference on Technologies for Sustainability (SusTech), Portland, OR, USA, 2024SusTech 2024 - 2024 IEEE Conference on Technologies for Sustainability

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Conference

Improving the Reliability of 14C Dating of Snail Shells: Towards an Innovative Approach Using Conchiolin ; Fiabilisation de la datation 14C des coquilles d’escargots : vers une approche innovante par la conchyoline

Authors : Kader, Elias; Phouybanhdyt, Brian; Bridoux, Maxime C. ...

Subjects: Chimie; Coquilles; Nouvelle ApprocheOrsay; France

Source: Datations « absolues » en archéologie : 8e séminaire scientifique et technique de l’Inrap ; https://inrap.hal.science/hal-04901861 ; Inrap. Datations « absolues » en archéologie : 8e

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Academic Journal

An improved accelerated degradation model for LED reliability assessment with self-heating impacts

Authors : Truong, Minh-Tuan; Do Van, Phuc; Mendizabal, Laurent ...

Subjects: LED; Reliability; Degradation modelling

Source: ISSN: 0026-2714.

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Book

Global reliability-oriented sensitivity analysis under distribution parameter uncertainty

Authors : Chabridon, Vincent; Balesdent, Mathieu; Perrin, Guillaume ...

Subjects: Bi-level input uncertainty; Disaggregated augmented vector; Global variance-based sensitivity indices

Source: Mechanical Engineering in Uncertainties From Classical Approaches to Some Recent Developments ; https://hal.science/hal-02877484 ; Mechanical Engineering in Uncertainties From Classical Approaches to

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Conference

Investigation of resistance fluctuations in ReRAM: physical origin, temporal dependence and impact on memory reliability

Authors : Reganaz, Lucas; Deleruyelle, Damien; Rafhay, Quentin ...

Subjects: [SPI.TRON]Engineering Sciences [physics]/ElectronicsMonterey; Californie; United States

Source: IRPS 2023 (IEEE International Reliability Physics Symposium) ; https://cea.hal.science/cea-04169237 ; IRPS 2023 (IEEE International

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Academic Journal

Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks

Authors : Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo ...

Subjects: Artificial Neural Network; Convolutional Neural Network; Encryption

Source: ISSN: 2169-3536.

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Academic Journal

Multi-Objective Optimization of Autonomous Microgrids with Reliability Consideration

Authors : Riou, Maël; Dupriez-Robin, Florian; Grondin, Dominique ...

Subjects: microgrid; off-grid; reliability

Source: ISSN: 1996-1073 ; Energies ; https://hal.science/hal-03676371 ; Energies, 2021, 14 (15), pp.4466. ⟨10.3390/en14154466⟩.

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فلترة النتائج

Reading reliability in 1S1R OTS+PCM devices based on Double-Patterned Self-Aligned structure

Human Reliability Assessment method applied to investigate human factors in NDT - The case of the interpretation of radiograms in the French nuclear sector

Ultra-fast CV methods (< 10µs) for interface trap spectroscopy and BTI reliability characterization using MOS capacitors

Eco-reliability: A new metric for the eco-design of electronic systems

Improving the Reliability of 14C Dating of Snail Shells: Towards an Innovative Approach Using Conchiolin ; Fiabilisation de la datation 14C des coquilles d’escargots : vers une approche innovante par la conchyoline

An improved accelerated degradation model for LED reliability assessment with self-heating impacts

Global reliability-oriented sensitivity analysis under distribution parameter uncertainty

Investigation of resistance fluctuations in ReRAM: physical origin, temporal dependence and impact on memory reliability

Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks

Multi-Objective Optimization of Autonomous Microgrids with Reliability Consideration

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