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Conference

Effective field and universal mobility in high-k metal gate UTBB-FDSOI devices

Subjects: coefficient η; silicon transistor mobility; FDSOI universal mobilityUdine; Italy

  • Source: 2014 ICMTS Proceedings27th International Conference on Microelectronic Test Structures (ICMTS)https://hal.science/hal-0110247427th International Conference on Microelectronic Test

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Conference

A universal spintronic technology based on Multifunctional Standardized Stack

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsGrenoble; France

  • Source: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)DATE 2020 - 23rd Design, Automation and Test in Europe Conference and Exhibitionhttps://hal.science/hal-03753403

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