Item request has been placed! ×
Item request cannot be made. ×
loading  Processing Request
Item request has been placed! ×
Item request cannot be made. ×
loading  Processing Request
Academic Journal

3D Logic circuit design oriented electrothermal modeling of vertical junctionless nanowire FETs

Subjects: Verilog-A; 3D electronics; vertical nanowire transistor

  • Source: ISSN: 2329-9231 ; IEEE Journal on Exploratory Solid-State Computational Devices and Circuits ; https://hal.science/hal-04230911 ; IEEE Journal on Exploratory Solid-State Computational Devices and

تفاصيل العنوان

×
Academic Journal

CNTFET modeling and reconfigurable logic circuit design

Subjects: CNTFET; circuit-design; PACS 8542

  • Source: ISSN: 0098-4094 ; IEEE Transactions on Circuits and Systems ; https://hal.science/hal-00187137 ; IEEE Transactions on Circuits and Systems, 2007, 54 (11), pp.2365-2379.

تفاصيل العنوان

×
Dissertation/ Thesis

Compact modeling and circuit design based on spin injection ; Modélisation compacte et conception de circuit à base d'injection de spin

Subjects: All spin logic; Compact modeling; Design methodology

  • Source: https://theses.hal.science/tel-01720258 ; Electronics. Université Paris Saclay (COmUE), 2017. English. ⟨NNT : 2017SACLS240⟩.

تفاصيل العنوان

×
Academic Journal

Fully depleted, trench-pinned photo gate for CMOS image sensor applications

Subjects: Capacitive sensors; Charge transfer; CMOS integrated circuits

  • Source: ISSN: 1424-8220 ; Sensors ; https://hal.science/hal-03770921 ; Sensors, 2020, 20 (3), pp.727. ⟨10.3390/s20030727⟩ ; https://www.mdpi.com/1424-8220/20/3/727.

تفاصيل العنوان

×
Conference

An integrated class D audio amplifier based on sliding mode control

Subjects: feedback; Switching audio amplifier; linearityGrenoble; France

  • Source: IEEE International Conference on Integrated Circuit Design and Technology ; https://hal.science/hal-01103736 ; IEEE International

تفاصيل العنوان

×
Conference

Rebooting Computing: The Challenges for Test and Reliability

Subjects: Index Terms-Alternative computing architectures; emerging technology; fault modelNoordwijk; Netherlands

  • Source: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)https://hal.science/hal-024621942019 IEEE International Symposium on Defect and

تفاصيل العنوان

×
  • 1-10 ل  11 نتائج ل ""Circuit design""