Item request has been placed! ×
Item request cannot be made. ×
loading  Processing Request

نتائج البحث

Display Settings
النتائج لكل صفحة: 10
Sort By: Relevance
Filter
  • 1-10 of  52 نتائج ل ""Girard, Patrick""

فلترة النتائج

Collection : Archive Ouverte Hal (Hyper Article En Ligne, Ccsd - Centre Pour La Communication Scientifique Directe) Publisher : ieee فلترة بواسطة : مؤلف
إعادة تعيين خيارات الفبترة
Item request has been placed! ×
Item request cannot be made. ×
loading  Processing Request
Conference

High Performance and DNU-Recovery Spintronic Retention Latch for Hybrid MTJ/CMOS Technology

Subjects: Radiation hardening; Latch reliability; Soft errorAntwerp; Belgium

  • Source: DATE 2023 - Design, Automation & Test in Europe Conference & Exhibition ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04240330 ; DATE 2023 - Design, Automation & Test in Europe Conference & Exhibition, Apr

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
Conference

Intra-cell Resistive-Open Defect Analysis on a Foundry 8T SRAM-based IMC Architecture

Subjects: In-Memory Computing; 8T SRAM cell; Resistive-open defectVenise; Italy

  • Source: ETS 2023 - 28th IEEE European Test Symposium ; https://hal.science/hal-04164663 ; ETS 2023 - 28th IEEE European Test Symposium, May 2023,

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
Academic Journal

LDAVPM: A Latch Design and Algorithm-based Verification Protected against Multiple-Node-Upsets in Harsh Radiation Environments

Subjects: Latch design; Algorithm-based verification; Fault tolerance

  • Source: ISSN: 0278-0070 ; IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03770056 ;

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
Academic Journal

Non-Volatile Latch Designs with Node-Upset Tolerance and Recovery using Magnetic Tunnel Junctions and CMOS

Subjects: MTJ; Fault tolerance; Radiation hardening

  • Source: ISSN: 1063-8210 ; IEEE Transactions on Very Large Scale Integration (VLSI) Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239391 ;

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
Academic Journal

A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications

Subjects: Radiation protection; Circuit hardening; Flip-flop reliability

  • Source: ISSN: 2168-2356 ; IEEE Design & Test ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04236363 ; IEEE Design & Test, 2023, 40 (4), pp.34-41.

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
Conference

SCLCRL: Shuttling C-elements based Low-Cost and Robust Latch Design Protected against Triple Node Upsets in Harsh Radiation Environments

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsVirtual; France

  • Source: DATE 2022 - 25th Design, Automation and Test in Europe Conference and Exhibition ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03769070 ; DATE 2022 - 25th Design, Automation and Test in Europe Conference and

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
Conference

A Highly Reliable and Low Power RHBD Flip-Flop Cell for Aerospace Applications

Subjects: radiation hardness; circuit reliability; flip-flop cellSan Diego; CA; United States

  • Source: VTS 2022 - IEEE 40th VLSI Test Symposium ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03770473 ; VTS 2022 - IEEE 40th VLSI Test Symposium, Apr

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
Conference

A Generic Fast and Low Cost BIST Solution for CMOS Image Sensors

Subjects: CMOS image sensor; BIST; optical testSpainBarcelona, Spain

  • Source: ETS 2022 - 27th IEEE European Test Symposium ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03770756 ; ETS 2022 - 27th IEEE European Test

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
Conference

Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries

Subjects: software-based self-test; software test libraries; in-field testSpainBarcelona, Spain

  • Source: ETS 2022 - 27th IEEE European Test Symposium ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03739788 ; ETS 2022 - 27th IEEE European Test

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
Conference

Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement

Subjects: software-based self-test; software test libraries; on-line testTorino; Italy

  • Source: IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS 2021) ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03380201 ;

تفاصيل العنوان

اقرأ أكثر حفظ في قائمتي
×
  • 1-10 of  52 نتائج ل ""Girard, Patrick""