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النتائج لكل صفحة: 10

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Collection : Aix-Marseille Universite

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Academic Journal

Reliability-driven pin assignment optimization to improve in-orbit soft-error rate

Authors : Aguiar, Y.Q.; Wrobel, Frédéric; Autran, J-L ...

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

Source: ISSN: 0026-2714.

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Dissertation/ Thesis

Circuit level assessment of future CMOS technologies (sub 50nm) ; Evaluation des futures technologies CMOS (

Authors : Sellier, Manuel;

Subjects: variability; wire resistance; critical length

Source: https://theses.hal.science/tel-00631246 ; Micro et nanotechnologies/Microélectronique. Université de Provence - Aix-Marseille I, 2008. Français. ⟨NNT : ⟩.

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