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Prediction of wax appearance temperature and solid wax amount by reduced spectral analysis using FTIR spectroscopy

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  • Publication Date:
    December 04, 2012
  • معلومة اضافية
    • Patent Number:
      8,326,548
    • Appl. No:
      12/785441
    • Application Filed:
      May 22, 2010
    • نبذة مختصرة :
      A method that uses corrected areas integrated at two different wavelength ranges, 1402-1324 cm−1 and 735-715 cm−1. The invention uses the reduced form of FTIR spectral integration. The invention provides reliable data in the variety of applications regardless of FTIR spectral instability occurring unexpectedly, such as loading sample thickness, sample cell location changes of FTIR light source passes, volume changes during cooling procedure, existence of emulsified water, moisture building on the surface of FTIR crystals.
    • Inventors:
      Oh, Kyeongseok Oh (Salt Lake City, UT, US)
    • Assignees:
      Oh, Kyeongseok (Salt Lake City, UT, US)
    • Claim:
      1. A method for determining a wax appearance temperature for a material comprising: a first process comprising; performing a reduced spectral analysis on the material and producing a first wavelength range at a temperature; determining a first area for a second wavelength range wherein the first area is defined by the area under a first peak of the reduced spectral analysis; determining a second area for a third wavelength range wherein the second area is defined by the area under a second peak of the reduced spectral analysis; dividing the first area and the second area to calculate a numerical data point; a second process comprising; repeating the first process at least three times using the material at a different temperature for each repetition and calculating a numerical data point for each process; creating a data representation showing the division of the first area and the second area versus the temperatures; determining a slope change in the data representation; and using the slope change to determining the wax appearance temperature for the material.
    • Claim:
      2. The method of claim 1 wherein the first wavelength range is between 1402 and 1324 cm −1 .
    • Claim:
      3. The method of claim 1 wherein the material is an oil.
    • Claim:
      4. The method of claim 3 wherein the material property determined is the wax appearance temperature.
    • Claim:
      5. The method of claim 1 further comprising determining a value based on the slope change.
    • Claim:
      6. The method of claim 1 wherein the second wavelength range is from 1402 to 1324 cm −1 .
    • Claim:
      7. The method of claim 1 further comprising: determining a numerical difference between related data points; and multiplying the difference by a constant.
    • Claim:
      8. The method of claim 1 wherein the material is gas condensate.
    • Claim:
      9. The method of claim 1 wherein the material is in multiphase flow.
    • Claim:
      10. A method for determining a wax appearance temperature and a solid wax amount in an oil comprising: a first process comprising; performing a reduced spectral analysis on the oil at a first temperature and producing a first wavelength at a range of 4000 and 400 cm −1 ; determining a first area for a wavelength range from 1402 to 1324 cm −1 wherein the first area is defined by the area under a first peak of the reduced spectral analysis; determining a second area for a wavelength range from 735 to 715 cm −1 wherein the second area is defined by the area under a second peak of the reduced spectral analysis; dividing the first area and the second area to calculate a numerical data point; a second process comprising; repeating the first process at least three times with the oil at a different temperature for each repetition and calculating a numerical data point for each process; creating a Cartesian graph showing the division of the first area and the second area versus the temperatures wherein the graph shows a first line and a second line; determining a slope change in the graph where the first line and the second line intersect; and using the slope change to determining the wax appearance temperature for the material and the solid wax amount in the oil.
    • Claim:
      11. The method of claim 10 further comprising: determining a numerical difference between the first line and second line along a vertical axis; and multiplying the numerical difference by a constant.
    • Claim:
      12. The method of claim 10 where the oil is crude oil.
    • Claim:
      13. The method of claim 10 where the oil is shale oil.
    • Claim:
      14. The method of claim 10 where the oil is emulsified oil.
    • Claim:
      15. The method of claim 10 wherein the reduced spectral analysis uses clear NaCI crystals.
    • Claim:
      16. The method of claim 10 wherein the reduced spectral analysis uses opaque NaCI crystals.
    • Claim:
      17. The method of claim 10 further comprising the use of a PTFE IR Card to continuously collect the reduced spectral analysis data.
    • Current U.S. Class:
      702/25
    • Patent References Cited:
      6035706 March 2000 Campagnolo et al.
      6841779 January 2005 Roehner et al.
    • Primary Examiner:
      Bui, Bryan
    • الرقم المعرف:
      edspgr.08326548