QTL Mapping and Transcriptome Analysis to Identify Differentially Expressed Genes Induced by Septoria Tritici Blotch Disease of Wheat

Resistance to Septoria tritici blotch (STB) is an economically important trait in many wheat-breeding programs across the world. Several quantitative trait loci (QTL) for STB resistance were identified in wheat but due to the dynamic pathogen population it is necessary to continuously identify new resistance genes/QTL and determine the underlying resistance mechanism. In this work, we integrated QTL mapping and transcriptome profiling to identify candidate genes underlying QTL associated with STB resistance in bread wheat at the seedling stage. The results revealed four QTL on chromosomes 1BS, 1BL, 3AS and 3DL for STB resistance. Among these, two QTL on 2BL and 3DL were mapped for chlorosis, necrosis and pycnidia while the other two on 1BS and 3AS were associated with necrosis and pycnidia. Among the four identified QTL, genes were identified in three QTL (1BS, 2BL and 3DL). In total, 238 differentially expressed genes (DEGs) were localized in 1BS, 16 DEGs in 2BL and 80 DEGs in 3DL QTL region respectively. F-box protein, NBS-LRR disease resistance genes and receptor-like protein kinase were the most over-represented. The results emphasize the importance of integrating QTL and transcriptome analysis to accelerate the identification of key genes underlying the traits of interest.