Item request has been placed! ×
Item request cannot be made. ×
loading  Processing Request

Spatial resolution of nanostructural analysis by electron energy-loss spectroscopy and energy-filtered imaging

Item request has been placed! ×
Item request cannot be made. ×
loading   Processing Request
  • معلومة اضافية
    • بيانات النشر:
      Oxford University Press
    • الموضوع:
      1999
    • Collection:
      HighWire Press (Stanford University)
    • نبذة مختصرة :
      We consider several factors which determine the spatial resolution of elemental analysis by core-loss spectroscopy or energy-filtered imaging. The physics of electron scattering, in combination with modern electron optics, allows a resolution below 1 nm. However, the low core-loss cross sections imply that atomic resolution is only feasible for radiation-resistant specimens and an electron microscope fitted with a field-emission source.
    • File Description:
      text/html
    • Relation:
      http://jmicro.oxfordjournals.org/cgi/content/short/48/6/711; http://dx.doi.org/10.1093/oxfordjournals.jmicro.a023739
    • الرقم المعرف:
      10.1093/oxfordjournals.jmicro.a023739
    • الدخول الالكتروني :
      http://jmicro.oxfordjournals.org/cgi/content/short/48/6/711
      https://doi.org/10.1093/oxfordjournals.jmicro.a023739
    • Rights:
      Copyright (C) 1999, Japanese Society of Microscopy
    • الرقم المعرف:
      edsbas.EACEF6F2