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Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study

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  • معلومة اضافية
    • Contributors:
      Test and dEpendability of microelectronic integrated SysTems (TEST); Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM); Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS); University of Jyväskylä (JYU); Space Technology Research Laboratory UFSC (SpaceLab); Universidade Federal de Santa Catarina = Federal University of Santa Catarina Florianópolis (UFSC); ISIS Facility; STFC Rutherford Appleton Laboratory (RAL); Science and Technology Facilities Council (STFC)-Science and Technology Facilities Council (STFC); Agence Spatiale Européenne = European Space Agency (ESA)
    • بيانات النشر:
      HAL CCSD
    • الموضوع:
      2021
    • Collection:
      LIRMM: HAL (Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier)
    • الموضوع:
      Montpellier; France
    • نبذة مختصرة :
      International audience ; This study analyses the response of synchronous dynamic random access memories to neutron irradiation. Three different generations of the same device with different node sizes (63, 72, and 110 nm) were characterized under an atmospheric-like neutron spectrum at the ChipIr beamline in the Rutherford Appleton Laboratories, UK. The memories were tested with a reduced refresh rate to expose more single-event upsets and under similar conditions provided by a board specifically developed for this type of study in test facilities. The board has also been designed to be used as a nanosatellite payload in order to perform similar tests. The neutron-induced failures were studied and characterized, presenting the occurrence of single-bit upsets and stuck bits. The cross sections for each type of event and technology node show that the 110 nm model is more sensitive to neutron-induced single-event effects than the other models.
    • Relation:
      lirmm-03357444; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03357444; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03357444/document; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03357444/file/2021_DTIS____HAL_Version__Technology_Impact_on_Neutron_Induced_Effects_in_SDRAMs__A_Comparative_Study.pdf
    • الرقم المعرف:
      10.1109/DTIS53253.2021.9505143
    • Rights:
      info:eu-repo/semantics/OpenAccess
    • الرقم المعرف:
      edsbas.E517CE5A