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Advanced Structural Analysis Of Silicon Solar Cells
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- المؤلفون: Papež, Nikola
- المصدر:
Proceedings of the 25st Conference STUDENT EEICT 2019. s. 723-727. ISBN 978-80-214-5735-5
- الموضوع:
- نوع التسجيلة:
conference object
- اللغة:
English
- معلومة اضافية
- بيانات النشر:
Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
- الموضوع:
2019
- Collection:
Brno University of Technology (VUT): Digital Library / Vysoké učení technické v Brně: Digitální knihovně
- نبذة مختصرة :
The study investigates the structural imperfections of photovoltaic cells based on polycrystalline silicon. Experimental characterization focuses in particular on the degradation and defects analysis. Two modern techniques were used – scanning electron microscopy (SEM) with electron beam induced current (EBIC) and 3D digital optical microscopy. The properties and range of cell defects that can significantly affect its function were characterized with this inspection and failure Analysis.
- File Description:
text; 723-727; application/pdf
- ISBN:
978-80-214-5735-5
80-214-5735-X
- Relation:
Proceedings of the 25st Conference STUDENT EEICT 2019; http://www.feec.vutbr.cz/EEICT/; http://hdl.handle.net/11012/186767
- Rights:
© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií ; openAccess
- الرقم المعرف:
edsbas.D69B8FAB
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