Item request has been placed!
×
Item request cannot be made.
×
Processing Request
Impact of CMOS Post Nitridation Annealing on Reliability of 40nm 512kB Embedded Flash Array
Item request has been placed!
×
Item request cannot be made.
×
Processing Request
- المؤلفون: Kempf, Thibault; Mantelli, Marc; Maugain, François; Regnier, Arnaud; Portal, Jean-Michel; Masson, Pascal; Moragues, Jean-Michel; Hesse, Marjorie; Della Marca, V.; Franck, Julien; Niel, Stephan
- المصدر:
2017 IEEE International Integrated Reliability Workshop (IIRW)
https://hal.science/hal-01900747
2017 IEEE International Integrated Reliability Workshop (IIRW), Oct 2017, Fallen Leaf Lake, CA, United States
- الموضوع:
- نوع التسجيلة:
conference object
- اللغة:
English
- معلومة اضافية
- Contributors:
Laboratoire de Polytech Nice-Sophia (Polytech'Lab); Université Nice Sophia Antipolis (1965 - 2019) (UNS)-Université Côte d'Azur (UniCA); Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP); Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS); STMicroelectronics Rousset (ST-ROUSSET); STMicroelectronics Crolles (ST-CROLLES)
- بيانات النشر:
HAL CCSD
- الموضوع:
2017
- Collection:
HAL Université Côte d'Azur
- الموضوع:
- نبذة مختصرة :
International audience
- Relation:
hal-01900747; https://hal.science/hal-01900747; https://hal.science/hal-01900747/document; https://hal.science/hal-01900747/file/Paper_Thibault_KEMPF_IIRW2017_v4.pdf
- الدخول الالكتروني :
https://hal.science/hal-01900747
https://hal.science/hal-01900747/document
https://hal.science/hal-01900747/file/Paper_Thibault_KEMPF_IIRW2017_v4.pdf
- Rights:
info:eu-repo/semantics/OpenAccess
- الرقم المعرف:
edsbas.D20BBC5A
No Comments.