نبذة مختصرة : The single atom thick two-dimensional graphene is a promising material for various applications due to its extraordinary electronic, optical, optoelectronic, and mechanical properties. The demand for developing graphene based applications has entailed a requirement for development of methods for fast imaging techniques for graphene. Here, we demonstrate imaging of graphene with femtosecond wide-field four-wave mixing microscopy. The method provides a sensitive, non-destructive approach for rapid large area characterization of graphene. We show that the method is suitable for online following of a laser patterning process of microscale structures on single-layer graphene. ; peerReviewed
Relation: Applied Physics Letters; 15; 108; Koivistoinen, J., Aumanen, J., Hiltunen, V.-M., Myllyperkiö, P., Johansson, A., & Pettersson, M. (2016). Real-time monitoring of graphene patterning with wide-field four-wave mixing microscopy. Applied Physics Letters , 108 (15), Article 153112. https://doi.org/10.1063/1.4946854; CONVID_25705316; TUTKAID_70027; URN:NBN:fi:jyu-201606032844; http://urn.fi/URN:NBN:fi:jyu-201606032844
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