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Design of intelligent supervision system for metrology center based on UWB technology

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  • المؤلفون: Wei, Lei; Yu, Jian; Zhao, Xingwang; Pan, Wei
  • المصدر:
    Journal of Physics: Conference Series ; volume 1983, issue 1, page 012070 ; ISSN 1742-6588 1742-6596
  • نوع التسجيلة:
    article in journal/newspaper
  • اللغة:
    unknown
  • معلومة اضافية
    • بيانات النشر:
      IOP Publishing
    • الموضوع:
      2021
    • نبذة مختصرة :
      With the comprehensive construction of the provincial metrology center, further digital management requirements are put forward for the daily operation and maintenance inspection work of the automated verification/testing area, the warehouse storage area, the material supporting turnover area and the temporary storage area, and the professional laboratory area. The article explains the UWB (ultra-wide band) technology and its principles and applies it to the smart supervision of the production area. It has developed functions such as basic information management, job attendance, positioning analysis, electronic fence, behavior monitoring, intelligent inspection and data analysis. The digital supervision plan has been verified in the actual production environment.
    • الرقم المعرف:
      10.1088/1742-6596/1983/1/012070
    • الرقم المعرف:
      10.1088/1742-6596/1983/1/012070/pdf
    • الدخول الالكتروني :
      http://dx.doi.org/10.1088/1742-6596/1983/1/012070
      https://iopscience.iop.org/article/10.1088/1742-6596/1983/1/012070
      https://iopscience.iop.org/article/10.1088/1742-6596/1983/1/012070/pdf
    • Rights:
      http://creativecommons.org/licenses/by/3.0/ ; https://iopscience.iop.org/info/page/text-and-data-mining
    • الرقم المعرف:
      edsbas.CC1D1863