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Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs

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  • معلومة اضافية
    • Contributors:
      Bernardi, Paolo; Guerriero, Augusto Maria; Insinga, Giorgio; Paganini, Giovanni; Carnevale, Giambattista; Coppetta, Matteo; Mischo, Walter; Ullmann, Rudolf
    • بيانات النشر:
      MDPI
    • الموضوع:
      2024
    • Collection:
      PORTO@iris (Publications Open Repository TOrino - Politecnico di Torino)
    • نبذة مختصرة :
      This paper describes a hardware/software strategy for the effective and efficient management of several distributed Memory Built-In Self-Test (MBIST) units orchestrated by a single CPU to enable the parallel testing of several memory banks. Experimental testing of the implementation on an Infineon chip shows up to a 25% test time reduction compared to traditional strategies, especially in cases for which there are a large number of failures affecting several banks. Additionally, it permits balanced failure collection from different banks in cases for which there are limitations to the storage of failure-related information.
    • Relation:
      info:eu-repo/semantics/altIdentifier/wos/WOS:001149064000001; volume:13; issue:2; numberofpages:16; journal:ELECTRONICS; https://hdl.handle.net/11583/2984950; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85183361206; https://www.mdpi.com/2079-9292/13/2/303
    • الرقم المعرف:
      10.3390/electronics13020303
    • الدخول الالكتروني :
      https://hdl.handle.net/11583/2984950
      https://doi.org/10.3390/electronics13020303
      https://www.mdpi.com/2079-9292/13/2/303
    • Rights:
      info:eu-repo/semantics/openAccess
    • الرقم المعرف:
      edsbas.C10BC9DA