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International Conference on Defects in Semiconductors : Proceedings of the International Conference on Defects in Semiconductors. (Materials Science Forum 10-12) / Application of optically detected magnetic resonance to the characterization of point defects in semiconductors

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اقرأ أكثر حفظ في قائمتي
  • المؤلفون: Spaeth, Johann-Martin
  • نوع التسجيلة:
    book part
    article in journal/newspaper
  • اللغة:
    English
  • معلومة اضافية
    • الموضوع:
      2009
    • Collection:
      Universitätsbibliothek Paderborn: Digitale Sammlungen
    • الموضوع:
      NW.2
    • Relation:
      vignette : https://digital.ub.uni-paderborn.de/titlepage/urn/urn:nbn:de:hbz:466:2-6291/128; eki:HBZCT004000608; http://nbn-resolving.org/urn:nbn:de:hbz:466:2-6291; https://nbn-resolving.org/urn:nbn:de:hbz:466:2-6291; system:CT004000608
    • Rights:
      free access
    • الرقم المعرف:
      edsbas.B9456038