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Multi-scale, Multi-physics Modeling and Simulation of Single Event Effects in Digital Electronics: from Particles to Systems

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  • معلومة اضافية
    • Contributors:
      Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP); Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS); Institut de Physique de Rennes (IPR); Université de Rennes (UR)-Centre National de la Recherche Scientifique (CNRS)
    • بيانات النشر:
      HAL CCSD
      Institute of Electrical and Electronics Engineers
    • الموضوع:
      2024
    • Collection:
      Aix-Marseille Université: HAL
    • نبذة مختصرة :
      International audience ; This review paper aims to provide a survey of modeling and simulation of single-event effects (SEEs) in digital electronics at device, circuit and system levels. It primarily focuses on the specific multi-scale, multi-physics, multi-domain nature of SEEs and on the main underlying physical mechanisms that lead to the occurrence of single events in digital devices and circuits. This review addresses the different ways to model and simulate both in space and time this complex sequence of mechanisms from the particle-material interaction up to the electrical response of a given electronics device, circuit, or system. It highlights the specific features of each methodology, and discusses simulation requirements, code or model inputs and expected outputs.
    • Relation:
      hal-04333942; https://amu.hal.science/hal-04333942; https://amu.hal.science/hal-04333942/document; https://amu.hal.science/hal-04333942/file/TNS_Review_Autran_Munteanu_2023_HAL.pdf
    • الرقم المعرف:
      10.1109/TNS.2023.3337288
    • Rights:
      info:eu-repo/semantics/OpenAccess
    • الرقم المعرف:
      edsbas.A34762A9