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Integration of III-V materials with arsenides and antimonides for the production of TriGate transistors and high mobility NWFET ; Intégration de matériaux III-V à base d’arséniures et d’antimoniures pour la réalisation de transistors TriGate et NW à haute mobilité

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  • معلومة اضافية
    • Contributors:
      Laboratoire des technologies de la microélectronique (LTM ); Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 ); Université Grenoble Alpes; Thierry Baron
    • بيانات النشر:
      HAL CCSD
    • الموضوع:
      2018
    • Collection:
      Archive ouverte HAL (Hyper Article en Ligne, CCSD - Centre pour la Communication Scientifique Directe)
    • نبذة مختصرة :
      The transistors’s miniaturization evolved through technological nodes with the successive introduction of new materials (high k) and new architectures (FinFET, NWFET). For the advanced technological nodes, a new break in material is considered to replace the silicon of the conduction channel with high mobility materials (2D, III-V). III-V materials are good candidates to address a solution to this problem thanks to their n-type (InGaAs, InAs, InSb)or p-type (GaSb) high mobility. During this PhD, a particular interest has been given to the InAs/GaSb pair of materials, which offers an additional advantage by its lattice parameter agreement making it possible to access n-type and p-type high mobility layers in the same structure.Nowadays, the growth of III-V materials directly on (001) -Si 300mm substrates is a challenge of major interest to develop industrial platforms compatible processes. These growths remain complex because of defects formation: antiphase boundaries, dislocations, cracks; generated respectively by the difference in polarity, lattice mismatch and difference in thermal expansion coefficient, between the silicon and III-V materials. In this PhD, we present a first demonstration of GaSb growth by MOVPE directly on nominal (001) -Si 300mm substrate compatible with industrial platforms. The GaSb layers have a sub-1nm surface roughness, and an equal to MBE state of the art crystalline quality. The growth of a InAs layer then allowed the realization of an InAs FinFET multi-channel demonstrator. The latter was developed via a high resolution alternative lithographic technique based on the use of block copolymer. This simple method for producing conduction channels makes it possible to access a high density of wires, of small dimensions, and in only five manufacturingsteps. ; La miniaturisation des transistors a progressé par noeud technologique avec l’introduction successive de nouveaux matériaux (high k) et de nouvelles architectures (FinFET, NWFET). Pour les noeuds technologiques avancés, une nouvelle ...
    • Relation:
      NNT: 2018GREAT082; tel-02092576; https://tel.archives-ouvertes.fr/tel-02092576; https://tel.archives-ouvertes.fr/tel-02092576/document; https://tel.archives-ouvertes.fr/tel-02092576/file/CERBA_2018_diffusion.pdf
    • الدخول الالكتروني :
      https://tel.archives-ouvertes.fr/tel-02092576
      https://tel.archives-ouvertes.fr/tel-02092576/document
      https://tel.archives-ouvertes.fr/tel-02092576/file/CERBA_2018_diffusion.pdf
    • Rights:
      info:eu-repo/semantics/OpenAccess
    • الرقم المعرف:
      edsbas.6CEC323