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On refractive index of optical radiation of polycrystalline silicon films
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- معلومة اضافية
- بيانات النشر:
IOP Publishing
- الموضوع:
2020
- نبذة مختصرة :
Transmission spectra of layers of polycrystalline silicon on sapphire with a thickness of 0.1 … 0.8 µm were investigated. The refractive indices were determined in the range of 0.5 … 2.7 μm. An increase in the refractive index with decreasing wavelength was established. An increase in the film thickness from 0.1 to 0.8 μm led to a decrease in the refractive index from 3.2 to 2.8 at λ = 1.5 μm. Compared to single crystals, the refractive indices of polycrystalline films were lower. The data obtained can be used to build models for calculating the optical characteristics of complex compositions.
- الرقم المعرف:
10.1088/1742-6596/1658/1/012016
- الرقم المعرف:
10.1088/1742-6596/1658/1/012016/pdf
- Rights:
http://creativecommons.org/licenses/by/3.0/ ; https://iopscience.iop.org/info/page/text-and-data-mining
- الرقم المعرف:
edsbas.32C43351
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