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Tuning for yield : towards predictable deep-submicron manufacturing

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اقرأ أكثر حفظ في قائمتي
  • معلومة اضافية
    • Contributors:
      Otten, RHJM Ralph (Promotor); Jess, JAG Jochen (Promotor)
    • بيانات النشر:
      Technische Universiteit Eindhoven
    • الموضوع:
      2004
    • Collection:
      Eindhoven University of Technology (TU/e): Research Portal
    • File Description:
      application/pdf
    • Relation:
      http://repository.tue.nl/577528
    • Rights:
      Copyright (c) Naidu, SR Srinath
    • الرقم المعرف:
      edsbas.28B071BD