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Emerging Computing Devices: Challenges and Opportunities for Test and Reliability

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  • معلومة اضافية
    • Contributors:
      INL - Conception de Systèmes Hétérogènes (INL - CSH); Institut des Nanotechnologies de Lyon (INL); École Centrale de Lyon (ECL); Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL); Université de Lyon-École Supérieure de Chimie Physique Électronique de Lyon (CPE)-Institut National des Sciences Appliquées de Lyon (INSA Lyon); Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Lyon (ECL); Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS); Friedrich-Alexander Universität Erlangen-Nürnberg = University of Erlangen-Nuremberg (FAU); Vienna University of Technology = Technische Universität Wien (TU Wien); New York University Abu Dhabi; NYU System (NYU); Delft University of Technology (TU Delft); Test and dEpendability of microelectronic integrated SysTems (TEST); Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM); Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
    • بيانات النشر:
      HAL CCSD
      IEEE
    • الموضوع:
      2021
    • Collection:
      Université de Montpellier: HAL
    • الموضوع:
    • نبذة مختصرة :
      International audience ; The paper addresses some of the opportunities and challenges related to test and reliability of three major emerging computing paradigms; i.e., Quantum Computing, Computing engines based on Deep Neural Networks for AI, and Approximate Computing (AxC). We present a quantum accelerator showing that it can be done even without the presence of very good qubits. Then, we present Dependability for Arti)cial Intelligence (AI) oriented Hardware. Indeed, AI applications shown relevant resilience properties to faults, meaning that the testing strongly depends on the application behavior rather than on the hardware structure. We will cover AI hardware design issues due to manufacturing defects, aging faults, and soft errors. Finally, We present the use of AxC to reduce the cost of hardening a digital circuit without impacting its reliability. In other words how to go beyond usual modular redundancy scheme.
    • Relation:
      lirmm-03379074; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03379074; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03379074/document; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03379074/file/Emerging_Computing_Devices_Challenges_and_Opportunities_for_Test_and_Reliability.pdf
    • الرقم المعرف:
      10.1109/ETS50041.2021.9465409
    • الدخول الالكتروني :
      https://hal-lirmm.ccsd.cnrs.fr/lirmm-03379074
      https://hal-lirmm.ccsd.cnrs.fr/lirmm-03379074/document
      https://hal-lirmm.ccsd.cnrs.fr/lirmm-03379074/file/Emerging_Computing_Devices_Challenges_and_Opportunities_for_Test_and_Reliability.pdf
      https://doi.org/10.1109/ETS50041.2021.9465409
    • Rights:
      info:eu-repo/semantics/OpenAccess
    • الرقم المعرف:
      edsbas.1C580F85