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The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis

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اقرأ أكثر حفظ في قائمتي
  • معلومة اضافية
    • Contributors:
      Ministerio de Economía y Competitividad (España); Comunidad de Madrid
    • بيانات النشر:
      IEEE
    • الموضوع:
      2020
    • Collection:
      Universidad Carlos III de Madrid: e-Archivo
    • نبذة مختصرة :
      This work proposes a methodology to diagnoseradiation-induced faults in a microprocessor using the hardwaretrace infrastructure. The diagnosis capabilities of this approachare demonstrated for an ARM microprocessor under neutronand proton irradiation campaigns. The experimental resultsdemonstrate that the execution status in the precise moment thatthe error occurred can be reconstructed, so that error diagnosiscan be achieved.
    • ISSN:
      0018-9499
    • Relation:
      Gobierno de España. ESP2015-68245-C4-1-P; Comunidad de Madrid. IND2017/TIC-7776; Pena-Fernandez, M., Lindoso, A., Entrena, L. & Garcia-Valderas, M. (2020). The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis. IEEE Transactions on Nuclear Science, 67(1), pp. 126–134.; http://hdl.handle.net/10016/32699; https://doi.org/10.1109/TNS.2019.2956204; 126; 134; IEEE Transactions on Nuclear Science; 67; AR/0000025517
    • الرقم المعرف:
      10.1109/TNS.2019.2956204
    • Rights:
      © 2020, IEEE ; open access
    • الرقم المعرف:
      edsbas.182D2640